Works matching IS 00778923 AND DT 1978 AND VI 306 AND IP 1


Results: 24
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    IMAGE ANALYSIS AND BEAM DAMAGE.

    Published in:
    Annals of the New York Academy of Sciences, 1978, v. 306, n. 1, p. 95, doi. 10.1111/j.1749-6632.1978.tb25642.x
    By:
    • Burge, R. E.;
    • Scott, R. F.;
    • Thorn, J.
    Publication type:
    Article
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    COMMENTS ON NONDESTRUCTIVE MICROSCOPY.

    Published in:
    Annals of the New York Academy of Sciences, 1978, v. 306, n. 1, p. 156, doi. 10.1111/j.1749-6632.1978.tb25646.x
    By:
    • Marton, L.
    Publication type:
    Article
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    OPENING REMARKS.

    Published in:
    Annals of the New York Academy of Sciences, 1978, v. 306, n. 1, p. 1, doi. 10.1111/j.1749-6632.1978.tb25634.x
    By:
    • Parsons, Donald F.
    Publication type:
    Article
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    TRACE STRUCTURE ANALYSIS*.

    Published in:
    Annals of the New York Academy of Sciences, 1978, v. 306, n. 1, p. 121, doi. 10.1111/j.1749-6632.1978.tb25644.x
    By:
    • Hoppe, W.
    Publication type:
    Article
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    ION MICROSCOPY: HISTORY AND ACTUAL TRENDS.

    Published in:
    Annals of the New York Academy of Sciences, 1978, v. 306, n. 1, p. 158, doi. 10.1111/j.1749-6632.1978.tb25647.x
    By:
    • Grivet, Pierre;
    • Septier, A.
    Publication type:
    Article
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    THE FEASIBILITY OF HEAVY CHARGED-PARTICLE MICROSCOPY*.

    Published in:
    Annals of the New York Academy of Sciences, 1978, v. 306, n. 1, p. 322, doi. 10.1111/j.1749-6632.1978.tb25657.x
    By:
    • Yang, T. C.;
    • Welch, G.;
    • Tobias, C. A.;
    • Maccabee, H.;
    • Hayes, T.;
    • Craise, L.;
    • Benton, E. V.;
    • Abrams, F.
    Publication type:
    Article
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