Works matching IS 00498246 AND DT 2020 AND VI 49 AND IP 5
Results: 13
Calendar Article.
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- XRS: X-ray Spectrometry, 2020, v. 49, n. 5, p. 626, doi. 10.1002/xrs.3192
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News article.
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- XRS: X-ray Spectrometry, 2020, v. 49, n. 5, p. 625, doi. 10.1002/xrs.3190
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Impact of intensity ratio correction on WDXRF spectra from interpretation from 2θ scale to energy scale.
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- XRS: X-ray Spectrometry, 2020, v. 49, n. 5, p. 622, doi. 10.1002/xrs.3171
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X‐ray fluorescence determination of major elements in ferromanganese nodules.
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- XRS: X-ray Spectrometry, 2020, v. 49, n. 5, p. 615, doi. 10.1002/xrs.3162
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K X‐ray satellite structures of bromine and molybdenum.
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- XRS: X-ray Spectrometry, 2020, v. 49, n. 5, p. 603, doi. 10.1002/xrs.3158
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Experimental determination of L fluorescence yields of gadolinium.
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- XRS: X-ray Spectrometry, 2020, v. 49, n. 5, p. 596, doi. 10.1002/xrs.3157
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Reverse Monte Carlo iterative algorithm for quantification of X‐ray fluorescence analysis based on MCNP6 simulation code.
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- XRS: X-ray Spectrometry, 2020, v. 49, n. 5, p. 587, doi. 10.1002/xrs.3154
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Effect of pressure on pressed pellets in XRS.
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- XRS: X-ray Spectrometry, 2020, v. 49, n. 5, p. 580, doi. 10.1002/xrs.3153
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Absolute measurement of photon flux using ionization chamber in (6~20) keV synchrotron radiation X‐rays.
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- XRS: X-ray Spectrometry, 2020, v. 49, n. 5, p. 572, doi. 10.1002/xrs.3152
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Monitoring dissolved active trace elements in biogas plants using total reflection X‐ray fluorescence spectrometry.
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- XRS: X-ray Spectrometry, 2020, v. 49, n. 5, p. 560, doi. 10.1002/xrs.3151
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Determination of binary systems based on light elements by the ratio of the Compton and Rayleigh scattering intensities.
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- XRS: X-ray Spectrometry, 2020, v. 49, n. 5, p. 554, doi. 10.1002/xrs.3150
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Scientific analysis of some glazed pottery unearthed from Warring States Chu tombs in Jiangling, Hubei Province: Indication for the origin of the low‐fired glazed pottery in China.
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- XRS: X-ray Spectrometry, 2020, v. 49, n. 5, p. 538, doi. 10.1002/xrs.3145
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Issue Information.
- Published in:
- XRS: X-ray Spectrometry, 2020, v. 49, n. 5, p. 537, doi. 10.1002/xrs.3095
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- Article