Works matching IS 00498246 AND DT 2020 AND VI 49 AND IP 4

Results: 11

Spherically bent mica analyzers as universal dispersing elements for X‐ray spectroscopy.

Published in:

XRS: X-ray Spectrometry, 2020, v. 49, n. 4, p. 493, doi. 10.1002/xrs.3143

By:

Joseph, Emily S.;
Jahrman, Evan P.;
Seidler, Gerald T.

Publication type:

Article

Calendar Article.

Published in:

XRS: X-ray Spectrometry, 2020, v. 49, n. 4, p. 534, doi. 10.1002/xrs.3177

By:

Sakurai, Kenji

Publication type:

Article

Cover Image, Volume 49, Issue 4.

Published in:

XRS: X-ray Spectrometry, 2020, v. 49, n. 4, p. i, doi. 10.1002/xrs.3174

By:

Akhter, Fardausi;
Fairhurst, Graham D.;
Blanchard, Peter E. R.;
Machin, Karen L.;
Blyth, Rob I. R.;
Thompson, Julie;
McLeod, Jamille;
Feng, Renfei;
Soos, Catherine

Publication type:

Article

X‐ray scattering and polarization in wavelength‐dispersive spectrometers.

Published in:

XRS: X-ray Spectrometry, 2020, v. 49, n. 4, p. 480, doi. 10.1002/xrs.3142

By:

Zhalsaraev, Batobolot Zhalsaraevich

Publication type:

Article

News article.

Published in:

XRS: X-ray Spectrometry, 2020, v. 49, n. 4, p. 533, doi. 10.1002/xrs.3176

By:

Sakurai, Kenji

Publication type:

Article

Provenance identification of ancient pottery from Hachijojima Island, part of Izu Islands (Tokyo, Japan), using X‐ray fluorescence spectrometry.

Published in:

XRS: X-ray Spectrometry, 2020, v. 49, n. 4, p. 515, doi. 10.1002/xrs.3149

By:

Ichikawa, Shintaro;
Matsumoto, Takehaya;
Nakamura, Toshihiro;
Kurisaki, Tsutomu

Publication type:

Article

Resonant electron impact excitation of highly charged Fe ions studied with a compact electron beam ion trap.

Published in:

XRS: X-ray Spectrometry, 2020, v. 49, n. 4, p. 511, doi. 10.1002/xrs.3148

By:

Monobe, Masashi;
Sakaue, Hiroyuki A.;
Kato, Daiji;
Murakami, Izumi;
Hara, Hirohisa;
Watanabe, Tetsuya;
Nakamura, Nobuyuki

Publication type:

Article

The composition and technology of polychrome enamels on Chinese ruby‐backed plates identified through nondestructive micro‐X‐ray fluorescence.

Published in:

XRS: X-ray Spectrometry, 2020, v. 49, n. 4, p. 502, doi. 10.1002/xrs.3144

By:

Norris, Dana;
Braekmans, Dennis;
Domoney, Kelly;
Shortland, Andrew

Publication type:

Article

Review of in situ X‐ray fluorescence analysis technology in China.

Published in:

XRS: X-ray Spectrometry, 2020, v. 49, n. 4, p. 458, doi. 10.1002/xrs.3135

By:

Ge, Liangquan;
Li, Fei

Publication type:

Article

Issue Information.

Published in:: XRS: X-ray Spectrometry, 2020, v. 49, n. 4, p. 457, doi. 10.1002/xrs.3094
Publication type:: Article

Experimental variation in the spatial deposition of trace metals in feathers revealed using synchrotron X‐ray fluorescence.

Published in:

XRS: X-ray Spectrometry, 2020, v. 49, n. 4, p. 471, doi. 10.1002/xrs.3140

By:

Akhter, Fardausi;
Fairhurst, Graham D.;
Blanchard, Peter E. R.;
Machin, Karen L.;
Blyth, Rob I. R.;
Thompson, Julie;
McLeod, Jamille;
Feng, Renfei;
Soos, Catherine

Publication type:

Article