Works matching IS 00498246 AND DT 2015 AND VI 44 AND IP 2
Results: 9
News Article.
- Published in:
- XRS: X-ray Spectrometry, 2015, v. 44, n. 2, p. 81, doi. 10.1002/xrs.2606
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- Publication type:
- Article
Calendar Article.
- Published in:
- 2015
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- Publication type:
- Calendar
Multivariate curve resolution alternating least squares in the quantitative determination of sulfur using overlapped S(K<sub>α</sub>)--Mo(L<sub>α</sub>) emission peaks by wavelength dispersive X-ray fluorescence spectrometry.
- Published in:
- XRS: X-ray Spectrometry, 2015, v. 44, n. 2, p. 75, doi. 10.1002/xrs.2587
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- Article
Determination of kernel emission spectrum of a mini X-ray tube for EDXRF applications.
- Published in:
- XRS: X-ray Spectrometry, 2015, v. 44, n. 2, p. 69, doi. 10.1002/xrs.2584
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- Publication type:
- Article
Choice of X-ray mass attenuation coefficients for PIXE analysis of silicate minerals and rocks.
- Published in:
- XRS: X-ray Spectrometry, 2015, v. 44, n. 2, p. 63, doi. 10.1002/xrs.2583
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- Publication type:
- Article
Methodology for the characterisation of characteristic spectral profiles, applied to chromium Kβ.
- Published in:
- XRS: X-ray Spectrometry, 2015, v. 44, n. 2, p. 54, doi. 10.1002/xrs.2579
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- Publication type:
- Article
Chemical and physical properties in layers and interfaces of nanolayered Si(100)/Ni/BC<sub>x</sub>N<sub>y</sub> stacks.
- Published in:
- XRS: X-ray Spectrometry, 2015, v. 44, n. 2, p. 48, doi. 10.1002/xrs.2578
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- Publication type:
- Article
A background subtraction approach based on complex wavelet transforms in EDXRF.
- Published in:
- XRS: X-ray Spectrometry, 2015, v. 44, n. 2, p. 41, doi. 10.1002/xrs.2576
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- Publication type:
- Article
Micro-PIXE analysis of doped SiO<sub>2</sub> fibres intended as TL dosimeters for radiation measurements.
- Published in:
- XRS: X-ray Spectrometry, 2015, v. 44, n. 2, p. 33, doi. 10.1002/xrs.2575
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- Article