Works matching IS 00498246 AND DT 2014 AND VI 43 AND IP 5
1
- XRS: X-ray Spectrometry, 2014, v. 43, n. 5, p. 305, doi. 10.1002/xrs.2556
- Article
2
- XRS: X-ray Spectrometry, 2014, v. 43, n. 5, p. 298, doi. 10.1002/xrs.2554
- Article
4
- XRS: X-ray Spectrometry, 2014, v. 43, n. 5, p. 292, doi. 10.1002/xrs.2552
- Article
5
- XRS: X-ray Spectrometry, 2014, v. 43, n. 5, p. 286, doi. 10.1002/xrs.2551
- Hadjipanteli, A.;
- Kourkoumelis, N.;
- Speller, R.
- Article
6
- XRS: X-ray Spectrometry, 2014, v. 43, n. 5, p. 278, doi. 10.1002/xrs.2550
- Yang, Qun;
- Deng, Biao;
- Du, Guohao;
- Xie, Honglan;
- Zhou, Guangzhao;
- Xiao, Tiqiao;
- Xu, Hongjie
- Article
7
- XRS: X-ray Spectrometry, 2014, v. 43, n. 5, p. 269, doi. 10.1002/xrs.2549
- Brücher, Martin;
- Bohlen, Alex;
- Becker, Maria;
- Hergenröder, Roland
- Article
8
- XRS: X-ray Spectrometry, 2014, v. 43, n. 5, p. 259, doi. 10.1002/xrs.2548
- Sieber, John R.;
- Mortensen, Adam
- Article
9
- XRS: X-ray Spectrometry, 2014, v. 43, n. 5, p. 253, doi. 10.1002/xrs.2547
- Cardoso, Simone C.;
- Gonçalves, Odair D.;
- Cusatis, Cesar
- Article