Study of the elemental composition of wine stoppers using PIXE.
- Published in:
- XRS: X-ray Spectrometry, 2013, v. 42, n. 3, p. 158, doi. 10.1002/xrs.2451
- By:
- Publication type:
- Article
Works matching IS 00498246 AND DT 2013 AND VI 42 AND IP 3
Results: 8
1
2
Trace elemental determination by portable total reflection X-ray fluorescence spectrometer with low wattage X-ray tube Trace elemental determination by portable total reflection X-ray fluorescence spectrometer with low wattage X-ray tube.
- Published in:
- XRS: X-ray Spectrometry, 2013, v. 42, n. 3, p. 171, doi. 10.1002/xrs.2445
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- Publication type:
- Article
3
X-ray fluorescence analysis of Co, Ni, Pd, Ag, and Au in the scrapped printed-circuit-board ash.
- Published in:
- XRS: X-ray Spectrometry, 2013, v. 42, n. 3, p. 134, doi. 10.1002/xrs.2444
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- Publication type:
- Article
4
Multivariate analysis of hyperspectral hard X-ray images.
- Published in:
- XRS: X-ray Spectrometry, 2013, v. 42, n. 3, p. 151, doi. 10.1002/xrs.2448
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- Publication type:
- Article
5
Full title - characterization of a Namban folding screen from the Edo period by means of EDXRF, SEM-EDS and Raman spectroscopy.
- Published in:
- XRS: X-ray Spectrometry, 2013, v. 42, n. 3, p. 128, doi. 10.1002/xrs.2443
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- Publication type:
- Article
6
Depth-selective elemental imaging of microSD card by confocal micro XRF analysis.
- Published in:
- XRS: X-ray Spectrometry, 2013, v. 42, n. 3, p. 123, doi. 10.1002/xrs.2442
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- Publication type:
- Article
7
Determination of the Al content in aluminum-modified SiO<sub>2</sub> stationary phases using X-ray scattering spectroscopy.
- Published in:
- XRS: X-ray Spectrometry, 2013, v. 42, n. 3, p. 165, doi. 10.1002/xrs.2453
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- Publication type:
- Article
8
H <sup>+</sup> and He <sup>2 +</sup> induced W L X-rays intensity ratios: part I, Si(Li) data and EDS high resolution insight.
- Published in:
- XRS: X-ray Spectrometry, 2013, v. 42, n. 3, p. 141, doi. 10.1002/xrs.2446
- By:
- Publication type:
- Article