Works matching IS 00498246 AND DT 2011 AND VI 40 AND IP 5


Results: 13
    1

    Characterization of EUV periodic multilayers.

    Published in:
    XRS: X-ray Spectrometry, 2011, v. 40, n. 5, p. 338, doi. 10.1002/xrs.1350
    By:
    • Le Guen, K.;
    • Hu, M.-H.;
    • André, J.-M.;
    • Jonnard, P.;
    • Wang, Z.;
    • Zhu, J.;
    • Galtayries, A.;
    • Meny, C.;
    • Meltchakov, E.;
    • Hecquet, C.;
    • Delmotte, F.
    Publication type:
    Article
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    News.

    Published in:
    XRS: X-ray Spectrometry, 2011, v. 40, n. 5, p. 399, doi. 10.1002/xrs.1356
    By:
    • Sakurai, Kenji
    Publication type:
    Article
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