Works matching IS 00498246 AND DT 2006 AND VI 35 AND IP 2
Results: 12
EDXRF determination of impurities in potassium dihydrogenphosphate single crystals and raw materials.
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- XRS: X-ray Spectrometry, 2006, v. 35, n. 2, p. 112, doi. 10.1002/xrs.874
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Improvement of reproducibility in grazing-exit EPMA (GE-EPMA).
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- XRS: X-ray Spectrometry, 2006, v. 35, n. 2, p. 89, doi. 10.1002/xrs.845
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New insights into the colour origin of archaeological Egyptian blue and green by XAFS at the Cu K-edge.
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- XRS: X-ray Spectrometry, 2006, v. 35, n. 2, p. 141, doi. 10.1002/xrs.885
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Theoretical influence coefficients for correction of matrix effects in x-ray fluorescence analysis of intermediate-thickness samples.
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- XRS: X-ray Spectrometry, 2006, v. 35, n. 2, p. 93, doi. 10.1002/xrs.867
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Trace element determination in hair by synchrotron x-ray fluorescence analysis: application to the hair of Napoleon I.
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- XRS: X-ray Spectrometry, 2006, v. 35, n. 2, p. 125, doi. 10.1002/xrs.878
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Resonant inelastic x-ray scattering from highly correlated dysprosium compounds.
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- XRS: X-ray Spectrometry, 2006, v. 35, n. 2, p. 106, doi. 10.1002/xrs.873
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Effects of selective excitation of x-ray fluorescence of light elements: fluorine, oxygen, nitrogen and carbon.
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- XRS: X-ray Spectrometry, 2006, v. 35, n. 2, p. 137, doi. 10.1002/xrs.884
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Determination of the properties of a polycapillary x-ray lens.
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- XRS: X-ray Spectrometry, 2006, v. 35, n. 2, p. 120, doi. 10.1002/xrs.876
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Automated printing technology as a new tool for liquid sample preparation for micro x-ray fluorescence (MXRF).
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- XRS: X-ray Spectrometry, 2006, v. 35, n. 2, p. 131, doi. 10.1002/xrs.882
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Total reflection x-ray fluorescence spectrometer with parallel primary beam.
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- XRS: X-ray Spectrometry, 2006, v. 35, n. 2, p. 116, doi. 10.1002/xrs.875
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X-ray absorption and x-ray fluorescence for the characterization of titanium oxide-modified HPLC silicas.
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- XRS: X-ray Spectrometry, 2006, v. 35, n. 2, p. 101, doi. 10.1002/xrs.868
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K. Janssens and R. van Grieken (Editors). Non-destructive microanalysis of cultural heritage materials. Elsevier, Amsterdam, 2004, pp. 800. ISBN: 0 444 50738 8.
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- XRS: X-ray Spectrometry, 2006, v. 35, n. 2, p. 146, doi. 10.1002/xrs.879
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