Layout and first XRF applications of the BAM line at BESSY II.
- Published in:
- XRS: X-ray Spectrometry, 2005, v. 34, n. 2, p. 160, doi. 10.1002/xrs.750
- By:
- Publication type:
- Article
Works matching IS 00498246 AND DT 2005 AND VI 34 AND IP 2
Results: 19
1
2
Numerical simulations of photon transport inside a beam guide.
- Published in:
- XRS: X-ray Spectrometry, 2005, v. 34, n. 2, p. 164, doi. 10.1002/xrs.790
- By:
- Publication type:
- Article
3
Determination of L-shell intensity ratios for Yb, Hf and Ta by a parameter refinement method.
- Published in:
- XRS: X-ray Spectrometry, 2005, v. 34, n. 2, p. 124, doi. 10.1002/xrs.772
- By:
- Publication type:
- Article
4
Uncertainty and traceability in alloy analysis by borate fusion and XRF.
- Published in:
- XRS: X-ray Spectrometry, 2005, v. 34, n. 2, p. 153, doi. 10.1002/xrs.789
- By:
- Publication type:
- Article
5
Distribution of Pb and Zn in slices of human bone by synchrotron µ-XRF.
- Published in:
- XRS: X-ray Spectrometry, 2005, v. 34, n. 2, p. 140, doi. 10.1002/xrs.788
- By:
- Publication type:
- Article
6
Effect of crystal structure on the background intensity in XRF.
- Published in:
- XRS: X-ray Spectrometry, 2005, v. 34, n. 2, p. 169, doi. 10.1002/xrs.780
- By:
- Publication type:
- Article
7
Determination of Mg and Ti in Ziegler-Natta catalysts by x-ray fluorescence spectrometry.
- Published in:
- XRS: X-ray Spectrometry, 2005, v. 34, n. 2, p. 131, doi. 10.1002/xrs.777
- By:
- Publication type:
- Article
8
Atomic spectroscopy in elemental analysis. Edited by M. Cullen Blackwell. Publishing, Oxford, UK, 2003, ISBN 1-84127-333-3.
- Published in:
- XRS: X-ray Spectrometry, 2005, v. 34, n. 2, p. 172, doi. 10.1002/xrs.799
- By:
- Publication type:
- Article
9
A new approach to the determination of the Fano factor for semiconductor detectors.
- Published in:
- XRS: X-ray Spectrometry, 2005, v. 34, n. 2, p. 106, doi. 10.1002/xrs.754
- By:
- Publication type:
- Article
10
Studies on the composition of ancient Indian punch-marked silver coins.
- Published in:
- XRS: X-ray Spectrometry, 2005, v. 34, n. 2, p. 128, doi. 10.1002/xrs.776
- By:
- Publication type:
- Article
11
Analysis of supported zirconocenes by x-ray emission and absorption techniques.
- Published in:
- XRS: X-ray Spectrometry, 2005, v. 34, n. 2, p. 101, doi. 10.1002/xrs.753
- By:
- Publication type:
- Article
12
Monte Carlo study of quantitative EPMA analysis of a non-conducting sample with a coating film.
- Published in:
- XRS: X-ray Spectrometry, 2005, v. 34, n. 2, p. 96, doi. 10.1002/xrs.798
- By:
- Publication type:
- Article
13
Analysis and localization of metal- and metalloid-containing proteins by synchrotron radiation x-ray fluorescence spectrometry.
- Published in:
- XRS: X-ray Spectrometry, 2005, v. 34, n. 2, p. 112, doi. 10.1002/xrs.760
- By:
- Publication type:
- Article
14
Layout and first XRF applications of the BAM line at BESSY II Riesemeier et al. X-Ray Spectrometry 2000; 34 160-163.
- Published in:
- XRS: X-ray Spectrometry, 2005, v. 34, n. 2, p. 173, doi. 10.1002/xrs.827
- Publication type:
- Article
15
Trace element categorization of pollution sources in the equator town of Nanyuki, Kenya.
- Published in:
- XRS: X-ray Spectrometry, 2005, v. 34, n. 2, p. 118, doi. 10.1002/xrs.771
- By:
- Publication type:
- Article
16
New editors and advisory board members of X-Ray Spectrometry.
- Published in:
- XRS: X-ray Spectrometry, 2005, v. 34, n. 2, p. 89, doi. 10.1002/xrs.816
- By:
- Publication type:
- Article
17
Electron probe microanalysis (EPMA) measurement of aluminum oxide film thickness in the nanometer range on aluminum sheets.
- Published in:
- XRS: X-ray Spectrometry, 2005, v. 34, n. 2, p. 92, doi. 10.1002/xrs.797
- By:
- Publication type:
- Article
18
Elemental characterization of airborne particles in Khartoum, Sudan.
- Published in:
- XRS: X-ray Spectrometry, 2005, v. 34, n. 2, p. 144, doi. 10.1002/xrs.770
- By:
- Publication type:
- Article
19
A new portable XRF spectrometer with beam stability control.
- Published in:
- XRS: X-ray Spectrometry, 2005, v. 34, n. 2, p. 135, doi. 10.1002/xrs.785
- By:
- Publication type:
- Article