Works matching IS 00498246 AND DT 2005 AND VI 34 AND IP 1
Results: 15
Semiempirical approach for standardless calibration in µ-XRF spectrometry using capillary lenses.
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- XRS: X-ray Spectrometry, 2005, v. 34, n. 1, p. 19, doi. 10.1002/xrs.781
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- Article
Development of a portable x-ray fluorescence spectrometer equipped with two monochromatic x-ray sources and silicon drift detector and field analysis of Islamic glasses at an excavation site in Egypt.
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- XRS: X-ray Spectrometry, 2005, v. 34, n. 1, p. 46, doi. 10.1002/xrs.752
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- Article
Concentrations and sources of trace elements in particulate air pollution, Dar es Salaam, Tanzania, studied by EDXRF.
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- XRS: X-ray Spectrometry, 2005, v. 34, n. 1, p. 1, doi. 10.1002/xrs.774
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- Article
Natural water specimen preparation for TXRF analysis using a Johansson wavelength-dispersive spectrometer.
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- XRS: X-ray Spectrometry, 2005, v. 34, n. 1, p. 56, doi. 10.1002/xrs.756
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- Article
Use of C.
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- XRS: X-ray Spectrometry, 2005, v. 34, n. 1, p. 73, doi. 10.1002/xrs.767
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- Article
Empirical coefficients models for x-ray fluorescence analysis of intermediate-thickness samples.
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- XRS: X-ray Spectrometry, 2005, v. 34, n. 1, p. 11, doi. 10.1002/xrs.778
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- Article
Analysis of the effects of geometry on the fluorescence radiation field in the frame of transport theory.
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- XRS: X-ray Spectrometry, 2005, v. 34, n. 1, p. 7, doi. 10.1002/xrs.749
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- Article
A new way of measuring the contribution of scattered photons to x-ray fluorescence yields in secondary excitation mode.
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- XRS: X-ray Spectrometry, 2005, v. 34, n. 1, p. 80, doi. 10.1002/xrs.740
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- Article
Electron shake process following inner-shell ionization.
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- XRS: X-ray Spectrometry, 2005, v. 34, n. 1, p. 64, doi. 10.1002/xrs.762
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- Article
L
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- XRS: X-ray Spectrometry, 2005, v. 34, n. 1, p. 35, doi. 10.1002/xrs.784
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- Article
Energy-dispersive XRF spectrometer for Ti determination (TITAN).
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- XRS: X-ray Spectrometry, 2005, v. 34, n. 1, p. 69, doi. 10.1002/xrs.766
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- Article
X-ray fluorescence analysis applied to geochemistry of quartz in Argentina.
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- XRS: X-ray Spectrometry, 2005, v. 34, n. 1, p. 59, doi. 10.1002/xrs.761
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- Article
An external PIXE study: Mughal painting pigments.
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- XRS: X-ray Spectrometry, 2005, v. 34, n. 1, p. 42, doi. 10.1002/xrs.758
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- Article
Influence of and correction for moisture in rocks, soils and sediments on in situ XRF analysis.
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- XRS: X-ray Spectrometry, 2005, v. 34, n. 1, p. 28, doi. 10.1002/xrs.782
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- Article
Spectrum function of polarizer-scattered x-ray tube radiation.
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- XRS: X-ray Spectrometry, 2005, v. 34, n. 1, p. 52, doi. 10.1002/xrs.786
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- Article