Works matching IS 00498246 AND DT 2003 AND VI 32 AND IP 3
1
- XRS: X-ray Spectrometry, 2003, v. 32, n. 3, p. 179, doi. 10.1002/xrs.593
- Article
2
- XRS: X-ray Spectrometry, 2003, v. 32, n. 3, p. 258, doi. 10.1002/xrs.648
- Article
3
- XRS: X-ray Spectrometry, 2003, v. 32, n. 3, p. 248, doi. 10.1002/xrs.647
- Anders Rindby;
- Koen Janssens;
- Janos Osan
- Article
4
- XRS: X-ray Spectrometry, 2003, v. 32, n. 3, p. 229, doi. 10.1002/xrs.646
- Article
5
- XRS: X-ray Spectrometry, 2003, v. 32, n. 3, p. 223, doi. 10.1002/xrs.644
- Article
6
- XRS: X-ray Spectrometry, 2003, v. 32, n. 3, p. 171, doi. 10.1002/xrs.640
- Article
7
- XRS: X-ray Spectrometry, 2003, v. 32, n. 3, p. 239, doi. 10.1002/xrs.636
- Article
8
- XRS: X-ray Spectrometry, 2003, v. 32, n. 3, p. 215, doi. 10.1002/xrs.635
- K. Proost;
- L. Vincze;
- K. Janssens;
- N. Gao;
- E. Bulska;
- M. Schreiner;
- G. Falkenberg
- Article
9
- XRS: X-ray Spectrometry, 2003, v. 32, n. 3, p. 208, doi. 10.1002/xrs.625
- Article
10
- XRS: X-ray Spectrometry, 2003, v. 32, n. 3, p. 195, doi. 10.1002/xrs.623
- Article
11
- XRS: X-ray Spectrometry, 2003, v. 32, n. 3, p. 186, doi. 10.1002/xrs.599
- Article
12
- XRS: X-ray Spectrometry, 2003, v. 32, n. 3, p. 172, doi. 10.1002/xrs.587
- A. Bjeoumikhov;
- N. Langhoff;
- R. Wedell;
- V. Beloglazov;
- N. Lebed'ev;
- N. Skibina
- Article