Works matching IS 00498246 AND DT 2003 AND VI 32 AND IP 2
Results: 13
Improvement of peak-to-background ratio in PIXE and XRF methods using thin Si-PIN detectors.
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- XRS: X-ray Spectrometry, 2003, v. 32, n. 2, p. 93, doi. 10.1002/xrs.621
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- Article
X-ray absorption spectroscopic study on gold particles formed on titania and alumina.
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- XRS: X-ray Spectrometry, 2003, v. 32, n. 2, p. 158, doi. 10.1002/xrs.632
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- Article
Evolution of KL satellite of F in CaF.
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- XRS: X-ray Spectrometry, 2003, v. 32, n. 2, p. 89, doi. 10.1002/xrs.607
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- Article
Measurements of L subshell and L shell x-ray fluorescence cross-sections for U and Th.
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- XRS: X-ray Spectrometry, 2003, v. 32, n. 2, p. 161, doi. 10.1002/xrs.618
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- Article
Thin-film characterization with x-ray microanalysis. Extending and improving invariant embedding results.
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- XRS: X-ray Spectrometry, 2003, v. 32, n. 2, p. 148, doi. 10.1002/xrs.629
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- Article
Measurements of Coster-Kronig enhancement factors of some elements in the atomic number range 66 ≤ Z ≤ 72.
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- XRS: X-ray Spectrometry, 2003, v. 32, n. 2, p. 153, doi. 10.1002/xrs.631
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- Article
Determination of absorption correction by the 'two masses' method for XRF analysis of intermediate samples.
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- XRS: X-ray Spectrometry, 2003, v. 32, n. 2, p. 113, doi. 10.1002/xrs.624
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Description of Compton peaks in energy-dispersive x-ray fluorescence spectra.
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- XRS: X-ray Spectrometry, 2003, v. 32, n. 2, p. 139, doi. 10.1002/xrs.628
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- Article
New associate editor and members of the advisory board.
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- XRS: X-ray Spectrometry, 2003, v. 32, n. 2, p. 81, doi. 10.1002/xrs.634
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A risk assessment study of heavy metals in ambient air by WD-XRF spectrometry using aerosol-generated filter standards.
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- XRS: X-ray Spectrometry, 2003, v. 32, n. 2, p. 129, doi. 10.1002/xrs.627
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- Article
Calculation of attenuation and x-ray fluorescence intensities for non-parallel x-ray beams.
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- XRS: X-ray Spectrometry, 2003, v. 32, n. 2, p. 106, doi. 10.1002/xrs.622
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Towards tests of QED in Lamb-shift measurements of highly charged ions.
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- XRS: X-ray Spectrometry, 2003, v. 32, n. 2, p. 83, doi. 10.1002/xrs.615
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- Article
Application of the backscatter fundamental parameter method for in situ element determination using a portable energy-dispersive x-ray fluorescence spectrometer.
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- XRS: X-ray Spectrometry, 2003, v. 32, n. 2, p. 119, doi. 10.1002/xrs.626
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- Article