Works matching IS 00498246 AND DT 2003 AND VI 32 AND IP 1
Results: 14
Application of selected fundamental parameters in x-ray fluorescence analysis.
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- XRS: X-ray Spectrometry, 2003, v. 32, n. 1, p. 8, doi. 10.1002/xrs.611
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Reducing the publication time of articles in X-Ray Spectrometry.
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- XRS: X-ray Spectrometry, 2003, v. 32, n. 1, p. 1, doi. 10.1002/xrs.633
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Speciation of inclusions and precipitates in steel by means of XRF and LEEIXS.
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- XRS: X-ray Spectrometry, 2003, v. 32, n. 1, p. 29, doi. 10.1002/xrs.619
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Lι, Lα.
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- XRS: X-ray Spectrometry, 2003, v. 32, n. 1, p. 46, doi. 10.1002/xrs.610
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Further investigation of majolica ceramics assigned to the Puebla (Mexico) provenance by radioisotope induced x-ray fluorescence.
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- XRS: X-ray Spectrometry, 2003, v. 32, n. 1, p. 25, doi. 10.1002/xrs.614
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XRF analysis of micronutrients in endive grown on soils with sewage sludge.
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- XRS: X-ray Spectrometry, 2003, v. 32, n. 1, p. 57, doi. 10.1002/xrs.580
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Kβ/Kα x-ray intensity ratios for bromine and iodine compounds.
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- XRS: X-ray Spectrometry, 2003, v. 32, n. 1, p. 60, doi. 10.1002/xrs.620
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Patterns of inter-elemental effects in EDXRF and a new correction method.
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- XRS: X-ray Spectrometry, 2003, v. 32, n. 1, p. 52, doi. 10.1002/xrs.613
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Literature trends in x-ray emission spectrometry in the period 1990-2000-a review.
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- XRS: X-ray Spectrometry, 2003, v. 32, n. 1, p. 35, doi. 10.1002/xrs.606
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HOPG as powerful x-ray optics.
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- XRS: X-ray Spectrometry, 2003, v. 32, n. 1, p. 64, doi. 10.1002/xrs.617
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Quantitative determination of major systematics in synchrotron x-ray experiments: seeing through harmonic components.
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- XRS: X-ray Spectrometry, 2003, v. 32, n. 1, p. 69, doi. 10.1002/xrs.630
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Contributions of double interaction processes to x-ray fluorescence intensity.
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- XRS: X-ray Spectrometry, 2003, v. 32, n. 1, p. 13, doi. 10.1002/xrs.612
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X-ray propagation through single crystals in an anomalous scattering range and determination of permittivity tensor components by transmission experiments.
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- XRS: X-ray Spectrometry, 2003, v. 32, n. 1, p. 3, doi. 10.1002/xrs.605
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Effect of technological characteristics of powder material on the fluorescence intensity of elemental analytical lines.
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- XRS: X-ray Spectrometry, 2003, v. 32, n. 1, p. 40, doi. 10.1002/xrs.609
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- Article