Works matching IS 00498246 AND DT 2001 AND VI 30 AND IP 5
Results: 12
Evaluation of preconcentration methods for the determination of trace amounts of rare earth elements by x-ray fluorescence analysis using a conventional x-ray tube system and a synchrotron radiation source.
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- XRS: X-ray Spectrometry, 2001, v. 30, n. 5, p. 308, doi. 10.1002/xrs.503
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- Article
Synchrotron x-ray fluorescence and secondary ion mass spectrometry in tree ring microanalysis: applications to dendroanalysis.
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- XRS: X-ray Spectrometry, 2001, v. 30, n. 5, p. 338, doi. 10.1002/xrs.507
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- Article
Angular dependence of L.
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- XRS: X-ray Spectrometry, 2001, v. 30, n. 5, p. 287, doi. 10.1002/xrs.499
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Editorial: 50 Years of the Denver X-RAY Conference.
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- XRS: X-ray Spectrometry, 2001, v. 30, n. 5, p. 285, doi. 10.1002/xrs.531
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- Article
EDXRF and TXRF analysis of aerosol particles and the mobile fraction of soil in Botswana.
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- XRS: X-ray Spectrometry, 2001, v. 30, n. 5, p. 301, doi. 10.1002/xrs.502
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Speciation of sub-parts per billion levels of Cr(III) in waters by solid-phase adsorption followed by thin-layer x-ray fluorescence spectrometry.
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- XRS: X-ray Spectrometry, 2001, v. 30, n. 5, p. 330, doi. 10.1002/xrs.506
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Comparison of a compact energy-dispersive spectrometer with a wavelength-dispersive spectrometer for brass and stainless steel.
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- XRS: X-ray Spectrometry, 2001, v. 30, n. 5, p. 296, doi. 10.1002/xrs.501
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Individual particle characterization of Siberian aerosols by micro-PIXE and backscattering spectrometry.
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- XRS: X-ray Spectrometry, 2001, v. 30, n. 5, p. 320, doi. 10.1002/xrs.505
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Influence of detection limit on the measured concentration distribution of trace elements.
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- XRS: X-ray Spectrometry, 2001, v. 30, n. 5, p. 348, doi. 10.1002/xrs.509
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Theoretical model for the calculation of interference effects in TXRF and GEXRF.
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- XRS: X-ray Spectrometry, 2001, v. 30, n. 5, p. 292, doi. 10.1002/xrs.500
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Optimization of parameters in electron probe microanalysis.
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- XRS: X-ray Spectrometry, 2001, v. 30, n. 5, p. 313, doi. 10.1002/xrs.504
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- Article
Driftless gas proportional scintillation counter pulse analysis using digital processing techniques.
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- XRS: X-ray Spectrometry, 2001, v. 30, n. 5, p. 342, doi. 10.1002/xrs.508
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- Article