Editorial.
- Published in:
- XRS: X-ray Spectrometry, 2001, v. 30, n. 2, p. 67, doi. 10.1002/xrs.490
- By:
- Publication type:
- Article
Works matching IS 00498246 AND DT 2001 AND VI 30 AND IP 2
Results: 11
1
2
Measurement of detection efficiency and response functions for an Si(Li) x-ray spectrometer in the range 0.1-5 keV.
- Published in:
- XRS: X-ray Spectrometry, 2001, v. 30, n. 2, p. 69, doi. 10.1002/xrs.472
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- Publication type:
- Article
3
EPMA line analysis of chemical states of chromium.
- Published in:
- XRS: X-ray Spectrometry, 2001, v. 30, n. 2, p. 116, doi. 10.1002/xrs.476
- By:
- Publication type:
- Article
4
Method for the calculation of the chemical composition of a thin film by Monte Carlo simulation and electron probe microanalysis.
- Published in:
- XRS: X-ray Spectrometry, 2001, v. 30, n. 2, p. 110, doi. 10.1002/xrs.471
- By:
- Publication type:
- Article
5
Application of J. E. Fernández algorithms in the evaluation of x-ray intensities measured on fused glass discs for a set of international standards and a proposed calibration procedure.
- Published in:
- XRS: X-ray Spectrometry, 2001, v. 30, n. 2, p. 83, doi. 10.1002/xrs.468
- By:
- Publication type:
- Article
6
Theoretical study of a secondary target XRF setup at different operational tube voltages.
- Published in:
- XRS: X-ray Spectrometry, 2001, v. 30, n. 2, p. 99, doi. 10.1002/xrs.479
- By:
- Publication type:
- Article
7
Edited by Enrico Ciliberto and Giuseppe Spoto Modern Analytical Methods in Art and Archaeology. Vol. 155 in the Chemical Analysis Series John Wiley & Sons, New York, pp. 755. ISBN 0 471 29361 X.
- Published in:
- XRS: X-ray Spectrometry, 2001, v. 30, n. 2, p. 132, doi. 10.1002/xrs.470
- By:
- Publication type:
- Article
8
Multielemental x-ray fluorescence analysis by using a non-explicit description of the excitation beam.
- Published in:
- XRS: X-ray Spectrometry, 2001, v. 30, n. 2, p. 93, doi. 10.1002/xrs.478
- By:
- Publication type:
- Article
9
Surface studies by grazing-exit electron probe microanalysis (GE-EPMA).
- Published in:
- XRS: X-ray Spectrometry, 2001, v. 30, n. 2, p. 123, doi. 10.1002/xrs.480
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- Publication type:
- Article
10
Background spectrum of synchrotron radiation-excited total reflection x-ray fluorescence for Si wafer analysis.
- Published in:
- XRS: X-ray Spectrometry, 2001, v. 30, n. 2, p. 127, doi. 10.1002/xrs.477
- By:
- Publication type:
- Article
11
Size and origin of the escape peak in various Si(Li) detectors.
- Published in:
- XRS: X-ray Spectrometry, 2001, v. 30, n. 2, p. 77, doi. 10.1002/xrs.459
- By:
- Publication type:
- Article