Works matching IS 00498246 AND DT 2000 AND VI 29 AND IP 5
Results: 9
EDXRF surface shape correction for thick sample measurement using an outer mark membrane.
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- XRS: X-ray Spectrometry, 2000, v. 29, n. 5, p. 360, doi. 10.1002/1097-4539(200009/10)29:5<360::AID-XRS439>3.0.CO;2-I
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Capillary optics and their use in x-ray analysis.
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- XRS: X-ray Spectrometry, 2000, v. 29, n. 5, p. 343, doi. 10.1002/1097-4539(200009/10)29:5<343::AID-XRS414>3.0.CO;2-S
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Editorial.
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- XRS: X-ray Spectrometry, 2000, v. 29, n. 5, p. 325, doi. 10.1002/1097-4539(200009/10)29:5<325::AID-XRS454>3.0.CO;2-K
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Wave optics treatment of x-rays passing through tapered capillary guides.
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- XRS: X-ray Spectrometry, 2000, v. 29, n. 5, p. 354, doi. 10.1002/1097-4539(200009/10)29:5<354::AID-XRS436>3.0.CO;2-G
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A systematic database of thin-film measurements by EPMA Part II-Palladium films.
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- XRS: X-ray Spectrometry, 2000, v. 29, n. 5, p. 373, doi. 10.1002/1097-4539(200009/10)29:5<373::AID-XRS442>3.0.CO;2-S
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Determination of the zeolite and silicate content in detergent products by wavelength-dispersive x-ray fluorescence spectrometry.
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- XRS: X-ray Spectrometry, 2000, v. 29, n. 5, p. 365, doi. 10.1002/1097-4539(200009/10)29:5<365::AID-XRS441>3.0.CO;2-Q
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Determination of platinum levels in serum and urine samples from pediatric cancer patients by TXRF.
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- XRS: X-ray Spectrometry, 2000, v. 29, n. 5, p. 349, doi. 10.1002/1097-4539(200009/10)29:5<349::AID-XRS434>3.0.CO;2-8
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X-rays in research and development at the National Institute of Standards and Technology.
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- XRS: X-ray Spectrometry, 2000, v. 29, n. 5, p. 327, doi. 10.1002/1097-4539(200009/10)29:5<327::AID-XRS440>3.0.CO;2-R
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Detection limits of heavy elements obtained with K-series x-rays induced by electron accelerator bremsstrahlung.
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- XRS: X-ray Spectrometry, 2000, v. 29, n. 5, p. 339, doi. 10.1002/1097-4539(200009/10)29:5<339::AID-XRS309>3.0.CO;2-0
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