Works matching IS 00498246 AND DT 2000 AND VI 29 AND IP 4

Results: 9

Analysis of cement using low-resolution energy-dispersive x-ray fluorescence and partial least-squares regression.
Published in:
XRS: X-ray Spectrometry, 2000, v. 29, n. 4, p. 297, doi. 10.1002/1097-4539(200007/08)29:4<297::AID-XRS433>3.0.CO;2-J
By:
- Lemberge, P.;
- Van Espen, P. J.;
- Vrebos, B. A. R.
Publication type:
Article
Molybdenum x-ray emission spectroscopic study of vacancy-induced electronic states in V.
Published in:
XRS: X-ray Spectrometry, 2000, v. 29, n. 4, p. 279, doi. 10.1002/1097-4539(200007/08)29:4<279::AID-XRS426>3.0.CO;2-7
By:
- Acharya, B. S.;
- Rajeev;
- Pradhan, L. D.;
- Mishra, Pusparani;
- Nayak, B. B.
Publication type:
Article
L-shell x-ray relative intensities of some heavy elements excited by 20.48 keV x-rays.
Published in:
XRS: X-ray Spectrometry, 2000, v. 29, n. 4, p. 317, doi. 10.1002/1097-4539(200007/08)29:4<317::AID-XRS437>3.0.CO;2-C
By:
- Ismail, Adnan M.;
- Malhi, Nabil B.
Publication type:
Article
Determination of metals in polycarbonate foils by energy dispersive x-ray fluorescence methods.
Published in:
XRS: X-ray Spectrometry, 2000, v. 29, n. 4, p. 291, doi. 10.1002/1097-4539(200007/08)29:4<291::AID-XRS432>3.0.CO;2-3
By:
- Hołyńska, B.;
- de Koster, C. G.;
- Ostachowicz, J.;
- Samek, L.;
- Wȩgrzynek, D.
Publication type:
Article
Study of the monolithic x-ray focusing lens and its application in microbeam x-ray fluorescence analysis.
Published in:
XRS: X-ray Spectrometry, 2000, v. 29, n. 4, p. 305, doi. 10.1002/1097-4539(200007/08)29:4<305::AID-XRS425>3.0.CO;2-Q
By:
- Xie, Jindong;
- Yan, Yiming;
- Ding, Xunliang;
- He, Yejun;
- Pan, Qiuli
Publication type:
Article
A study of eighteenth century glass vessels from central Europe by x-ray fluorescence analysis.
Published in:
XRS: X-ray Spectrometry, 2000, v. 29, n. 4, p. 310, doi. 10.1002/1097-4539(200007/08)29:4<310::AID-XRS431>3.0.CO;2-E
By:
- Kunicki-Goldfinger, J.;
- Kierzek, J.;
- Kasprzak, A.;
- Małżewska-Bućko, B.
Publication type:
Article
From the Editor.
Published in:
XRS: X-ray Spectrometry, 2000, v. 29, n. 4, p. 265, doi. 10.1002/1097-4539(200007/08)29:4<265::AID-XRS446>3.0.CO;2-I
By:
- Van Grieken, Rene
Publication type:
Article
Calculation features of the fundamental parameter method in XRF.
Published in:
XRS: X-ray Spectrometry, 2000, v. 29, n. 4, p. 285, doi. 10.1002/1097-4539(200007/08)29:4<285::AID-XRS428>3.0.CO;2-C
By:
- Kitov, B. I.
Publication type:
Article
PIXE studies of emeralds.
Published in:
XRS: X-ray Spectrometry, 2000, v. 29, n. 4, p. 267, doi. 10.1002/1097-4539(200007/08)29:4<267::AID-XRS438>3.0.CO;2-7
By:
- Yu, K. N.;
- Tang, S. M.;
- Tay, T. S.
Publication type:
Article