Works matching IS 00498246 AND DT 2000 AND VI 29 AND IP 3
1
- XRS: X-ray Spectrometry, 2000, v. 29, n. 3, p. 249, doi. 10.1002/(SICI)1097-4539(200005/06)29:3<249::AID-XRS430>3.0.CO;2-1
- Steenstrup, S.;
- Gerward, L.;
- Hansen, K. Kielsgaard;
- Jensen, Signe Kamp
- Article
2
- XRS: X-ray Spectrometry, 2000, v. 29, n. 3, p. 239, doi. 10.1002/(SICI)1097-4539(200005/06)29:3<239::AID-XRS423>3.0.CO;2-V
- Wu, J;
- Leung, P. L.;
- Li, J. Z.;
- Stokes, M. J.;
- Li, Mike T. W.
- Article
3
- XRS: X-ray Spectrometry, 2000, v. 29, n. 3, p. 212, doi. 10.1002/(SICI)1097-4539(200005/06)29:3<212::AID-XRS422>3.0.CO;2-K
- Bastin, G. F.;
- Heijligers, H. J. M.
- Article
4
- XRS: X-ray Spectrometry, 2000, v. 29, n. 3, p. 203, doi. 10.1002/(SICI)1097-4539(200005/06)29:3<203::AID-XRS410>3.0.CO;2-P
- Article
5
- XRS: X-ray Spectrometry, 2000, v. 29, n. 3, p. 253, doi. 10.1002/(SICI)1097-4539(200005/06)29:3<253::AID-XRS424>3.0.CO;2-7
- Leung, P. L.;
- Peng, Z. C.;
- Stokes, M. J.;
- Li, Mike T. W.
- Article
6
- XRS: X-ray Spectrometry, 2000, v. 29, n. 3, p. 201, doi. 10.1002/(SICI)1097-4539(200005/06)29:3<201::AID-XRS435>3.0.CO;2-E
- Article
7
- XRS: X-ray Spectrometry, 2000, v. 29, n. 3, p. 245, doi. 10.1002/(SICI)1097-4539(200005/06)29:3<245::AID-XRS429>3.0.CO;2-O
- Martínez, V. Delgado;
- Hidalgo, C. Martínez;
- Barrea, R. A.
- Article
