Works matching IS 00498246 AND DT 2000 AND VI 29 AND IP 3
Results: 7
Correction for escape in x-ray spectra measured by NaI scintillation counters.
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- XRS: X-ray Spectrometry, 2000, v. 29, n. 3, p. 249, doi. 10.1002/(SICI)1097-4539(200005/06)29:3<249::AID-XRS430>3.0.CO;2-1
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EDXRF studies on blue and white Chinese Jingdezhen porcelain samples from the Yuan, Ming and Qing dynasties.
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- XRS: X-ray Spectrometry, 2000, v. 29, n. 3, p. 239, doi. 10.1002/(SICI)1097-4539(200005/06)29:3<239::AID-XRS423>3.0.CO;2-V
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A systematic database of thin-film measurements by EPMA Part I - Aluminum films.
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- XRS: X-ray Spectrometry, 2000, v. 29, n. 3, p. 212, doi. 10.1002/(SICI)1097-4539(200005/06)29:3<212::AID-XRS422>3.0.CO;2-K
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Development of total reflection x-ray fluorescence analysis at the Atominstitute of the Austrian Universities.
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- XRS: X-ray Spectrometry, 2000, v. 29, n. 3, p. 203, doi. 10.1002/(SICI)1097-4539(200005/06)29:3<203::AID-XRS410>3.0.CO;2-P
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X-ray fluorescence analysis by the fundamental parameters method without explicit knowledge of the excitation beam spectrum.
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- XRS: X-ray Spectrometry, 2000, v. 29, n. 3, p. 245, doi. 10.1002/(SICI)1097-4539(200005/06)29:3<245::AID-XRS429>3.0.CO;2-O
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EDXRF studies of porcelains (800-1600 A.D.) from Fujian, China with chemical proxies and principal component analysis.
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- XRS: X-ray Spectrometry, 2000, v. 29, n. 3, p. 253, doi. 10.1002/(SICI)1097-4539(200005/06)29:3<253::AID-XRS424>3.0.CO;2-7
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From the Editor.
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- XRS: X-ray Spectrometry, 2000, v. 29, n. 3, p. 201, doi. 10.1002/(SICI)1097-4539(200005/06)29:3<201::AID-XRS435>3.0.CO;2-E
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- Article