Works matching IS 00498246 AND DT 2000 AND VI 29 AND IP 2
Results: 11
K-Absorption spectral studies of some copper(II) mixed-ligand complexes.
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- XRS: X-ray Spectrometry, 2000, v. 29, n. 2, p. 187, doi. 10.1002/(SICI)1097-4539(200003/04)29:2<187::AID-XRS420>3.0.CO;2-I
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Measurement of K- to L- and M-shell radiative vacancy transfer probabilities in lanthanide elements by 59.54 keV photons.
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- XRS: X-ray Spectrometry, 2000, v. 29, n. 2, p. 151, doi. 10.1002/(SICI)1097-4539(200003/04)29:2<151::AID-XRS402>3.0.CO;2-Z
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Correlation of Wiener indices with x-ray K-absorption parameters of some copper(II) and cobalt(II) complexes.
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- XRS: X-ray Spectrometry, 2000, v. 29, n. 2, p. 161, doi. 10.1002/(SICI)1097-4539(200003/04)29:2<161::AID-XRS401>3.0.CO;2-0
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Chemical effects in x-ray fluorescence by study of Fe, Pt and U compounds.
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- XRS: X-ray Spectrometry, 2000, v. 29, n. 2, p. 173, doi. 10.1002/(SICI)1097-4539(200003/04)29:2<173::AID-XRS412>3.0.CO;2-Q
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From the Editor.
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- XRS: X-ray Spectrometry, 2000, v. 29, n. 2, p. 135, doi. 10.1002/(SICI)1097-4539(200003/04)29:2<135::AID-XRS427>3.0.CO;2-8
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Evaluation of energy-dispersive x-ray fluorescence spectrometry in the rapid analysis of silicate rocks using pressed powder pellets.
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- XRS: X-ray Spectrometry, 2000, v. 29, n. 2, p. 166, doi. 10.1002/(SICI)1097-4539(200003/04)29:2<166::AID-XRS411>3.0.CO;2-L
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Characterization of gem stones (rubies and sapphires) by energy-dispersive x-ray fluorescence spectrometry.
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- XRS: X-ray Spectrometry, 2000, v. 29, n. 2, p. 147, doi. 10.1002/(SICI)1097-4539(200003/04)29:2<147::AID-XRS370>3.0.CO;2-K
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Nuclear microscopic studies of inclusions in natural and synthetic emeralds.
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- XRS: X-ray Spectrometry, 2000, v. 29, n. 2, p. 178, doi. 10.1002/(SICI)1097-4539(200003/04)29:2<178::AID-XRS419>3.0.CO;2-R
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An introduction to superconducting tunnel junction detectors.
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- XRS: X-ray Spectrometry, 2000, v. 29, n. 2, p. 137, doi. 10.1002/(SICI)1097-4539(200003/04)29:2<137::AID-XRS356>3.0.CO;2-5
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Determination of the carbon content in coal and ash by XRF.
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- XRS: X-ray Spectrometry, 2000, v. 29, n. 2, p. 192, doi. 10.1002/(SICI)1097-4539(200003/04)29:2<192::AID-XRS421>3.0.CO;2-T
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Glancing-incidence and glancing-takeoff x-ray fluorescence analysis of Ni-GaAs interface reactions.
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- XRS: X-ray Spectrometry, 2000, v. 29, n. 2, p. 155, doi. 10.1002/(SICI)1097-4539(200003/04)29:2<155::AID-XRS403>3.0.CO;2-K
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