Works matching IS 00498246 AND DT 2000 AND VI 29 AND IP 1


Results: 14
    1

    Guest Editorial.

    Published in:
    XRS: X-ray Spectrometry, 2000, v. 29, n. 1, p. 1, doi. 10.1002/(SICI)1097-4539(200001/02)29:1<1::AID-XRS418>3.0.CO;2-Z
    By:
    • Lindgren, Eva Selin
    Publication type:
    Article
    2
    3

    Paintings- a challenge for XRF and PIXE analysis.

    Published in:
    XRS: X-ray Spectrometry, 2000, v. 29, n. 1, p. 101, doi. 10.1002/(SICI)1097-4539(200001/02)29:1<101::AID-XRS413>3.0.CO;2-A
    By:
    • Neelmeijer, C.;
    • Brissaud, I.;
    • Calligaro, T.;
    • Demortier, G.;
    • Hautojärvi, A.;
    • Mäder, M.;
    • Martinot, L.;
    • Schreiner, M.;
    • Tuurnala, T.;
    • Weber, G.
    Publication type:
    Article
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    13

    Use of microscopic XRF for non-destructive analysis in art and archaeometry.

    Published in:
    XRS: X-ray Spectrometry, 2000, v. 29, n. 1, p. 73, doi. 10.1002/(SICI)1097-4539(200001/02)29:1<73::AID-XRS416>3.0.CO;2-M
    By:
    • Janssens, K.;
    • Vittiglio, G.;
    • Deraedt, I.;
    • Aerts, A.;
    • Vekemans, B.;
    • Vincze, L.;
    • Wei, F.;
    • De Ryck, I.;
    • Schalm, O.;
    • Adams, F.;
    • Rindby, A.;
    • Knöchel, A.;
    • Simionovici, A.;
    • Snigirev, A.
    Publication type:
    Article
    14