Works matching IS 00498246 AND DT 1999 AND VI 28 AND IP 5
Results: 21
Mathematical model for evaluation of surface analysis data by total reflection XRF.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 5, p. 342, doi. 10.1002/(SICI)1097-4539(199909/10)28:5<342::AID-XRS360>3.0.CO;2-J
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Progress in superconducting tunnel junction detectors.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 5, p. 388, doi. 10.1002/(SICI)1097-4539(199909/10)28:5<388::AID-XRS371>3.0.CO;2-U
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Mercury collection from gas phase for XRF analysis.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 5, p. 352, doi. 10.1002/(SICI)1097-4539(199909/10)28:5<352::AID-XRS364>3.0.CO;2-6
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Investigation of geochemical composition of lake sediments using ED-XRF and ICP-AES techniques.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 5, p. 399, doi. 10.1002/(SICI)1097-4539(199909/10)28:5<399::AID-XRS375>3.0.CO;2-E
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Elastic scattering of photons: perspectives and present status.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 5, p. 376, doi. 10.1002/(SICI)1097-4539(199909/10)28:5<376::AID-XRS368>3.0.CO;2-H
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High-resolution x-ray spectroscopy with superconducting tunnel junctions.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 5, p. 309, doi. 10.1002/(SICI)1097-4539(199909/10)28:5<309::AID-XRS341>3.0.CO;2-1
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Elastic photon scattering and normalization of In Vivo XRF Analyses of Lead in Bone.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 5, p. 339, doi. 10.1002/(SICI)1097-4539(199909/10)28:5<339::AID-XRS363>3.0.CO;2-R
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High-resolution x-ray spectrometry using iridium-gold phase transition thermometers.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 5, p. 396, doi. 10.1002/(SICI)1097-4539(199909/10)28:5<396::AID-XRS374>3.0.CO;2-Q
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Guest Editorial.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 5, p. 307, doi. 10.1002/(SICI)1097-4539(199909/10)28:5<307::AID-XRS396>3.0.CO;2-O
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Determination of trace elements in aqueous solutions using the EMMA miniprobe XRF analyzer.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 5, p. 379, doi. 10.1002/(SICI)1097-4539(199909/10)28:5<379::AID-XRS367>3.0.CO;2-B
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Semiconductor drift detectors: applications and new devices.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 5, p. 312, doi. 10.1002/(SICI)1097-4539(199909/10)28:5<312::AID-XRS349>3.0.CO;2-Y
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Hard X-ray microbeam production with synchrotron radiation: application to microanalysis.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 5, p. 348, doi. 10.1002/(SICI)1097-4539(199909/10)28:5<348::AID-XRS362>3.0.CO;2-W
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3D modelling of unpolarized photon diffusion using the integral form of the transport equation.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 5, p. 327, doi. 10.1002/(SICI)1097-4539(199909/10)28:5<327::AID-XRS373>3.0.CO;2-X
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X-ray spectrometry of backscattered radiation in angiography laboratories.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 5, p. 317, doi. 10.1002/(SICI)1097-4539(199909/10)28:5<317::AID-XRS355>3.0.CO;2-U
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Speciation of heavy metals in peat with the use of total reflection x-ray spectrometry.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 5, p. 372, doi. 10.1002/(SICI)1097-4539(199909/10)28:5<372::AID-XRS366>3.0.CO;2-Z
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Multi-element characterization of estuarine sediments and waters.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 5, p. 410, doi. 10.1002/(SICI)1097-4539(199909/10)28:5<410::AID-XRS377>3.0.CO;2-3
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Synchrotron radiation X-Ray fluorescence at the LNLS: beamline instrumentation and experiments.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 5, p. 320, doi. 10.1002/(SICI)1097-4539(199909/10)28:5<320::AID-XRS359>3.0.CO;2-1
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Multi-element analysis of fine roots of Scots pine by total reflection x-ray fluorescence spectrometry.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 5, p. 335, doi. 10.1002/(SICI)1097-4539(199909/10)28:5<335::AID-XRS361>3.0.CO;2-8
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Delbrück and nuclear effects in photon scattering: recent developments.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 5, p. 357, doi. 10.1002/(SICI)1097-4539(199909/10)28:5<357::AID-XRS365>3.0.CO;2-P
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A semi-empirical derivation of thin-film sensitivities for EDXRF spectrometers.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 5, p. 406, doi. 10.1002/(SICI)1097-4539(199909/10)28:5<406::AID-XRS376>3.0.CO;2-Q
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Rayleigh to compton differential cross-section ratios in liquid xenon.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 5, p. 384, doi. 10.1002/(SICI)1097-4539(199909/10)28:5<384::AID-XRS369>3.0.CO;2-J
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