Works matching IS 00498246 AND DT 1999 AND VI 28 AND IP 3
Results: 13
Simultaneous determination of lead and sulfur by energy-dispersive x-ray spectrometry. Comparison between artificial neural networks and other multivariate calibration methods.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 3, p. 173, doi. 10.1002/(SICI)1097-4539(199905/06)28:3<173::AID-XRS333>3.0.CO;2-S
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Determination of major and minor ions in brines by x-ray fluorescence spectrometry: comparison with other common analytical methods.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 3, p. 168, doi. 10.1002/(SICI)1097-4539(199905/06)28:3<168::AID-XRS326>3.0.CO;2-6
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Evaluation of uncertainty of measurement in quantitative xrf analysis: I. Scattered Radiation Method.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 3, p. 157, doi. 10.1002/(SICI)1097-4539(199905/06)28:3<157::AID-XRS332>3.0.CO;2-L
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Calculation of average M shell fluorescence yields for elements with 29 ≤ Z ≤ 100.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 3, p. 198, doi. 10.1002/(SICI)1097-4539(199905/06)28:3<198::AID-XRS325>3.0.CO;2-6
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From the Editor.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 3, p. 133, doi. 10.1002/(SICI)1097-4539(199905/06)28:3<133::AID-XRS358>3.0.CO;2-F
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High-sensitivity XRF analyzer (OLIVIA) using a multi-crystal pyrographite assembly to reduce the continuous background.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 3, p. 145, doi. 10.1002/(SICI)1097-4539(199905/06)28:3<145::AID-XRS329>3.0.CO;2-8
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Use of layered synthetic microstructures for the quantitative x-ray analysis of light elements.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 3, p. 163, doi. 10.1002/(SICI)1097-4539(199905/06)28:3<163::AID-XRS331>3.0.CO;2-Z
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Approximation equations for K- and L-series x-ray transition energies.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 3, p. 135, doi. 10.1002/(SICI)1097-4539(199905/06)28:3<135::AID-XRS324>3.0.CO;2-O
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Combination of corrections for absorption, overlap and background in XRF spectrometry.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 3, p. 141, doi. 10.1002/(SICI)1097-4539(199905/06)28:3<141::AID-XRS328>3.0.CO;2-N
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Approximate model for calculation of x-ray fluorescence intensity and its use in XRF spectrometry.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 3, p. 183, doi. 10.1002/(SICI)1097-4539(199905/06)28:3<183::AID-XRS339>3.0.CO;2-9
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Determination of iron on cloths by wavelength-dispersive x-ray fluorescence spectrometry.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 3, p. 149, doi. 10.1002/(SICI)1097-4539(199905/06)28:3<149::AID-XRS330>3.0.CO;2-M
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MULTI: an interactive program for quantitation in EPMA.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 3, p. 194, doi. 10.1002/(SICI)1097-4539(199905/06)28:3<194::AID-XRS323>3.0.CO;2-O
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Isotope-source, energy-dispersive XRF analysis of geological materials using gas-filled proportional counters: signal deconvolution using simulated peak shapes.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 3, p. 178, doi. 10.1002/(SICI)1097-4539(199905/06)28:3<178::AID-XRS334>3.0.CO;2-A
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