Works matching IS 00498246 AND DT 1999 AND VI 28 AND IP 2
Results: 11
Quantitative energy-dispersive x-ray fluorescence analysis of liquids using partial least-squares regression.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 2, p. 77, doi. 10.1002/(SICI)1097-4539(199903/04)28:2<77::AID-XRS312>3.0.CO;2-C
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Simulation of x-ray spectra generated by electron impact on solids.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 2, p. 121, doi. 10.1002/(SICI)1097-4539(199903/04)28:2<121::AID-XRS305>3.0.CO;2-A
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Addendum.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 2, p. 128, doi. 10.1002/(SICI)1097-4539(199903/04)28:2<128::AID-XRS345>3.0.CO;2-M
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From the Editor.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 2, p. 75, doi. 10.1002/(SICI)1097-4539(199903/04)28:2<75::AID-XRS344>3.0.CO;2-9
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Calculations of x-ray emission spectra for sulfur dioxide by the DV-Xα method.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 2, p. 94, doi. 10.1002/(SICI)1097-4539(199903/04)28:2<94::AID-XRS315>3.0.CO;2-A
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Polycapillary x-ray optic spectral gain and transmission.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 2, p. 115, doi. 10.1002/(SICI)1097-4539(199903/04)28:2<115::AID-XRS319>3.0.CO;2-N
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A tunable focusing monochromator for total reflection x-ray fluorescence spectrometers.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 2, p. 110, doi. 10.1002/(SICI)1097-4539(199903/04)28:2<110::AID-XRS321>3.0.CO;2-O
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Measurement of L shell fluorescence yields of seven elements in the atomic number range 79⩽ Z⩽92 using photoionization.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 2, p. 91, doi. 10.1002/(SICI)1097-4539(199903/04)28:2<91::AID-XRS314>3.0.CO;2-M
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Determination of impurity lattice sites in single crystals using PIXE channeling.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 2, p. 105, doi. 10.1002/(SICI)1097-4539(199903/04)28:2<105::AID-XRS318>3.0.CO;2-R
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Microstructural and compositional characterization of Roman coins.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 2, p. 86, doi. 10.1002/(SICI)1097-4539(199903/04)28:2<86::AID-XRS313>3.0.CO;2-B
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Relativistic calculations of x-ray transition energies and emission rates for titanium atoms.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 2, p. 99, doi. 10.1002/(SICI)1097-4539(199903/04)28:2<99::AID-XRS317>3.0.CO;2-Q
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