Works matching IS 00498246 AND DT 1999 AND VI 28 AND IP 1
Results: 11
Calculation of x-ray tube spectral distributions.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 1, p. 27, doi. 10.1002/(SICI)1097-4539(199901/02)28:1<27::AID-XRS302>3.0.CO;2-R
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Estimation of absorbing layer thicknesses for an Si(Li) detector.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 1, p. 33, doi. 10.1002/(SICI)1097-4539(199901/02)28:1<33::AID-XRS306>3.0.CO;2-Q
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Determination of light elements in organic liquid matrices by principal component regression in EDXRS using backscattered radiation.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 1, p. 59, doi. 10.1002/(SICI)1097-4539(199901/02)28:1<59::AID-XRS310>3.0.CO;2-N
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Peculiarities of making gel-like specimens for x-ray fluorescence analysis.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 1, p. 24, doi. 10.1002/(SICI)1097-4539(199901/02)28:1<24::AID-XRS301>3.0.CO;2-2
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From the Editor.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 1, p. 1, doi. 10.1002/(SICI)1097-4539(199901/02)28:1<1::AID-XRS327>3.0.CO;2-I
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Retrospective study of the feasibility of using EDXRF for the attribution of blue and white porcelains.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 1, p. 19, doi. 10.1002/(SICI)1097-4539(199901/02)28:1<19::AID-XRS300>3.0.CO;2-S
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Theoretical calculations of detection limits in total reflection XRF analysis.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 1, p. 51, doi. 10.1002/(SICI)1097-4539(199901/02)28:1<51::AID-XRS308>3.0.CO;2-O
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Comparison between proton-induced x-ray emission (PIXE) and total reflection x-ray fluorescence (TXRF) spectrometry for the elemental analysis of human amniotic fluid.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 1, p. 3, doi. 10.1002/(SICI)1097-4539(199901/02)28:1<3::AID-XRS298>3.0.CO;2-5
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Imaging x-ray fluorescence spectroscopy using microchannel plate relay optics.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 1, p. 64, doi. 10.1002/(SICI)1097-4539(199901/02)28:1<64::AID-XRS303>3.0.CO;2-T
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Electron-probe microanalysis: some applications in the assessment of steel product quality.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 1, p. 41, doi. 10.1002/(SICI)1097-4539(199901/02)28:1<41::AID-XRS307>3.0.CO;2-S
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Characteristic x-ray imaging by means of filters.
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- XRS: X-ray Spectrometry, 1999, v. 28, n. 1, p. 9, doi. 10.1002/(SICI)1097-4539(199901/02)28:1<9::AID-XRS299>3.0.CO;2-L
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