Elemental Analysis of Polymetallic Nodules from the Central Indian Basin: a Study Using EDXRF
- Published in:
- XRS: X-ray Spectrometry, 1998, v. 27, n. 2, p. 105
- By:
- Publication type:
- Article
Works matching IS 00498246 AND DT 1998 AND VI 27 AND IP 2
Results: 11
1
2
Correction Method for Matrix Effect in X-Ray Fluorescence Spectrometric Analysis
- Published in:
- XRS: X-ray Spectrometry, 1998, v. 27, n. 2, p. 95
- By:
- Publication type:
- Article
3
Multivariate Analysis of Statistically Poor EDXRD Spectra for the Detection of Concealed Explosives
- Published in:
- XRS: X-ray Spectrometry, 1998, v. 27, n. 2, p. 87
- By:
- Publication type:
- Article
4
Accumulation of Elements in the Annual Rings of Scots Pine Trees in the Vicinity of a Copper-Nickel Smelter Measured by Scanning EDXRF
- Published in:
- XRS: X-ray Spectrometry, 1998, v. 27, n. 2, p. 133
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- Publication type:
- Article
5
News
- Published in:
- XRS: X-ray Spectrometry, 1998, v. 27, n. 2, p. 140
- Publication type:
- Article
6
Verification of Air Mass Trajectories in Long-Distance Transport Using EDXRF Analysis of Intersite Element Ratios
- Published in:
- XRS: X-ray Spectrometry, 1998, v. 27, n. 2, p. 121
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- Publication type:
- Article
7
Model for the Bremsstrahlung Spectrum in EPMA. Application to Standardless Quantification
- Published in:
- XRS: X-ray Spectrometry, 1998, v. 27, n. 2, p. 81
- By:
- Publication type:
- Article
8
Analysis of Archaeological Metals. The Place of XRF and PIXE in the Determination of Technology and Provenance
- Published in:
- XRS: X-ray Spectrometry, 1998, v. 27, n. 2, p. 73
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- Publication type:
- Article
9
Extraction and Rapid X-Ray Fluorescence Spectrometric Determination of Tungsten in Ore-Dressing Products of Scheelite
- Published in:
- XRS: X-ray Spectrometry, 1998, v. 27, n. 2, p. 117
- By:
- Publication type:
- Article
10
Standardless XRF Analysis of Stainless-Steel Samples
- Published in:
- XRS: X-ray Spectrometry, 1998, v. 27, n. 2, p. 111
- By:
- Publication type:
- Article
11
From the (New) Editor
- Published in:
- XRS: X-ray Spectrometry, 1998, v. 27, n. 2, p. 71
- By:
- Publication type:
- Article