Works matching IS 00498246 AND DT 1998 AND VI 27 AND IP 1
Results: 10
Determination of light elements using x-ray spectrometry. Part II-Boron in glass.
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- XRS: X-ray Spectrometry, 1998, v. 27, n. 1, p. 37, doi. 10.1002/(SICI)1097-4539(199801/02)27:1<37::AID-XRS246>3.0.CO;2-F
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EDXRF studies on the chemical composition of ancient porcelain bodies from Linjiang, Jiangxi, China.
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- XRS: X-ray Spectrometry, 1998, v. 27, n. 1, p. 11, doi. 10.1002/(SICI)1097-4539(199801/02)27:1<11::AID-XRS239>3.0.CO;2-R
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Determination of light elements using x-ray spectrometry. Part I-Analytical implications of using scattered tube lines.
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- XRS: X-ray Spectrometry, 1998, v. 27, n. 1, p. 31, doi. 10.1002/(SICI)1097-4539(199801/02)27:1<31::AID-XRS245>3.0.CO;2-#
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PROZA96: an improved matrix correction program for electron probe microanalysis, based on a double Gaussian φ(ρ z) approach.
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- XRS: X-ray Spectrometry, 1998, v. 27, n. 1, p. 3, doi. 10.1002/(SICI)1097-4539(199801/02)27:1<3::AID-XRS227>3.0.CO;2-L
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Focusing on one component each time-comparison of single and multiple component prediction algorithms in artificial neural networks for x-ray fluorescence analysis.
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- XRS: X-ray Spectrometry, 1998, v. 27, n. 1, p. 17, doi. 10.1002/(SICI)1097-4539(199801/02)27:1<17::AID-XRS240>3.0.CO;2-Z
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Determination of the phosphorus and sulphur content in edible oils and fats by wavelength-dispersive x-ray fluorescence spectrometry.
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- XRS: X-ray Spectrometry, 1998, v. 27, n. 1, p. 26, doi. 10.1002/(SICI)1097-4539(199801/02)27:1<26::AID-XRS244>3.0.CO;2-P
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IntriX: a numerical model for electron probe analysis at high depth resolution. Part II-tests and confrontation with experiments.
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- XRS: X-ray Spectrometry, 1998, v. 27, n. 1, p. 58, doi. 10.1002/(SICI)1097-4539(199801/02)27:1<58::AID-XRS248>3.0.CO;2-4
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From the (former) editor 'One more time'.
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- XRS: X-ray Spectrometry, 1998, v. 27, n. 1, p. 1, doi. 10.1002/(SICI)1097-4539(199801/02)27:1<1::AID-XRS288>3.0.CO;2-I
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K x-ray satellite spectrum of Ca excited by photons.
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- XRS: X-ray Spectrometry, 1998, v. 27, n. 1, p. 23, doi. 10.1002/(SICI)1097-4539(199801/02)27:1<23::AID-XRS243>3.0.CO;2-0
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IntriX: a numerical model for electron probe analysis at high depth resolution. Part I-Theoretical description.
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- XRS: X-ray Spectrometry, 1998, v. 27, n. 1, p. 43, doi. 10.1002/(SICI)1097-4539(199801/02)27:1<43::AID-XRS247>3.0.CO;2-N
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