Works matching IS 00498246 AND DT 1997 AND VI 26 AND IP 5
Results: 10
Proposed Correction and Influence of Drilling Fluids in X-Ray Fluorescence Logging.
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- XRS: X-ray Spectrometry, 1997, v. 26, n. 5, p. 303, doi. 10.1002/(SICI)1097-4539(199709)26:5<303::AID-XRS201>3.0.CO;2-D
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Theoretical Estimation of the Chemical Effect on K X-Ray Intensity Ratios for 4d Elements.
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- XRS: X-ray Spectrometry, 1997, v. 26, n. 5, p. 269, doi. 10.1002/(SICI)1097-4539(199709)26:5<269::AID-XRS205>3.0.CO;2-H
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Correction of Line Interference in X-Ray Fluorescence Trace Analysis. Application to Yttrium Determination in Silicate Rocks.
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- XRS: X-ray Spectrometry, 1997, v. 26, n. 5, p. 272, doi. 10.1002/(SICI)1097-4539(199709)26:5<272::AID-XRS238>3.0.CO;2-P
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X-Ray Fluorescence Analysis at the ICDD (Continued).
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- XRS: X-ray Spectrometry, 1997, v. 26, n. 5, p. 247, doi. 10.1002/(SICI)1097-4539(199709)26:5<247::AID-XRS273>3.0.CO;2-O
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Modifications to a Multiple Scattering Monte Carlo Model to Predict X-Ray Generation Curves.
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- XRS: X-ray Spectrometry, 1997, v. 26, n. 5, p. 275, doi. 10.1002/(SICI)1097-4539(199709)26:5<275::AID-XRS206>3.0.CO;2-P
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Electron Probe Microanalysis of Insulating Oxides: Monte Carlo Simulations.
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- XRS: X-ray Spectrometry, 1997, v. 26, n. 5, p. 291, doi. 10.1002/(SICI)1097-4539(199709)26:5<291::AID-XRS226>3.0.CO;2-X
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Simulation and Modelling of Thin Film ϕ(ρ z) Curves for Electron Probe Microanalysis.
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- XRS: X-ray Spectrometry, 1997, v. 26, n. 5, p. 279, doi. 10.1002/(SICI)1097-4539(199709)26:5<279::AID-XRS207>3.0.CO;2-A
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Application of XRF and Correspondence Analysis to Provenance Studies of Coastal and Inland Archaeological Pottery from the Mngeni River Area, South Africa.
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- XRS: X-ray Spectrometry, 1997, v. 26, n. 5, p. 249, doi. 10.1002/(SICI)1097-4539(199709)26:5<249::AID-XRS188>3.0.CO;2-5
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Multi-Element Analysis of Plants by WDXRF Using the Scattered Radiation Correction Method.
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- XRS: X-ray Spectrometry, 1997, v. 26, n. 5, p. 257, doi. 10.1002/(SICI)1097-4539(199709)26:5<257::AID-XRS199>3.0.CO;2-6
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First Use of NTD Germanium-Based Microcalorimeters For High-Resolution, Broadband X-Ray Microanalysis.
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- XRS: X-ray Spectrometry, 1997, v. 26, n. 5, p. 265, doi. 10.1002/(SICI)1097-4539(199709)26:5<265::AID-XRS204>3.0.CO;2-W
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