Found: 19
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Sub-keV X-Ray Spectroscopy Using a Low-Pressure Electron Counting Detector.
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- XRS: X-ray Spectrometry, 1997, v. 26, n. 4, p. 159, doi. 10.1002/(SICI)1097-4539(199707)26:4<159::AID-XRS196>3.0.CO;2-H
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Comparison of Grazing Emission XRF with Total Reflection XRF and Other X-Ray Emission Techniques.
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- XRS: X-ray Spectrometry, 1997, v. 26, n. 4, p. 153, doi. 10.1002/(SICI)1097-4539(199707)26:4<153::AID-XRS195>3.0.CO;2-1
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From the Editor: X-Ray Fluorescence Analysis at the ICDD.
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- XRS: X-ray Spectrometry, 1997, v. 26, n. 4, p. 145, doi. 10.1002/(SICI)1097-4539(199707)26:4<145::AID-XRS261>3.0.CO;2-8
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Combined Radioisotope XRF Analysis of Complex X-Ray Spectra in the Case of Magnetostrictive TbDyFe Thin Films.
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- XRS: X-ray Spectrometry, 1997, v. 26, n. 4, p. 174, doi. 10.1002/(SICI)1097-4539(199707)26:4<174::AID-XRS202>3.0.CO;2-B
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Book review: Introduction to X-Ray Powder Diffractometry. RON JENKINS and ROBERT L. SNYDER Volume 138 in Chemical Analysis, J. D. Winefordner, Series Editor. Wiley, New York, 1996, pp. 403+xxiii, £65, ISBN 0471513393.
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- XRS: X-ray Spectrometry, 1997, v. 26, n. 4, p. 245, doi. 10.1002/(SICI)1097-4539(199707)26:4<245::AID-XRS242>3.0.CO;2-4
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Total Reflection X-Ray Fluorescence Analysis Under Various Experimental Conditions.
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- XRS: X-ray Spectrometry, 1997, v. 26, n. 4, p. 203, doi. 10.1002/(SICI)1097-4539(199707)26:4<203::AID-XRS213>3.0.CO;2-E
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Si(Li) Detector Lineshapes: Contributions from Atomic Physics and Detector Properties.
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- XRS: X-ray Spectrometry, 1997, v. 26, n. 4, p. 223, doi. 10.1002/(SICI)1097-4539(199707)26:4<223::AID-XRS224>3.0.CO;2-8
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Si(Li) Detector Efficiency and Peak Shape Calibration in the Low-Energy Range Using Synchrotron Radiation.
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- XRS: X-ray Spectrometry, 1997, v. 26, n. 4, p. 195, doi. 10.1002/(SICI)1097-4539(199707)26:4<195::AID-XRS212>3.0.CO;2-5
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Rutherford Backscattering and X-Ray Fluorescence Analysis of Sediments.
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- XRS: X-ray Spectrometry, 1997, v. 26, n. 4, p. 179, doi. 10.1002/(SICI)1097-4539(199707)26:4<179::AID-XRS209>3.0.CO;2-C
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Energy-Dispersive X-Ray Fluorescence Analysis in Geochemical Mapping.
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- XRS: X-ray Spectrometry, 1997, v. 26, n. 4, p. 147, doi. 10.1002/(SICI)1097-4539(199707)26:4<147::AID-XRS193>3.0.CO;2-X
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Digital Risetime Discrimination for Peak Enhancement in Gas Proportional Scintillation Counter X-Ray Fluorescence Analysis.
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- XRS: X-ray Spectrometry, 1997, v. 26, n. 4, p. 182, doi. 10.1002/(SICI)1097-4539(199707)26:4<182::AID-XRS211>3.0.CO;2-I
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Application of Total Reflection XRF to Elemental Studies of Drinking Water.
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- XRS: X-ray Spectrometry, 1997, v. 26, n. 4, p. 165, doi. 10.1002/(SICI)1097-4539(199707)26:4<165::AID-XRS197>3.0.CO;2-P
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Photon Scattering by Compounds: an Assessment of the Validity of the Independent Atomic Model Approximation.
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- XRS: X-ray Spectrometry, 1997, v. 26, n. 4, p. 169, doi. 10.1002/(SICI)1097-4539(199707)26:4<169::AID-XRS200>3.0.CO;2-3
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Elemental Distribution in the Human Respiratory System and Excretion Organs: Absorption and Accumulation.
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- XRS: X-ray Spectrometry, 1997, v. 26, n. 4, p. 217, doi. 10.1002/(SICI)1097-4539(199707)26:4<217::AID-XRS215>3.0.CO;2-W
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Application of a Microstrip Gas Counter in Energy-Dispersive X-Ray Fluorescence Analysis.
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- XRS: X-ray Spectrometry, 1997, v. 26, n. 4, p. 237, doi. 10.1002/(SICI)1097-4539(199707)26:4<237::AID-XRS251>3.0.CO;2-1
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Total Reflection X-Ray Fluorescence Analysis Excited by Synchrotron Radiation (SR-TXRF): Variation of Excitation Conditions and Sample Geometries.
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- XRS: X-ray Spectrometry, 1997, v. 26, n. 4, p. 189, doi. 10.1002/(SICI)1097-4539(199707)26:4<189::AID-XRS210>3.0.CO;2-0
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Determination of Trace Elements in Mineral Water Using Total Reflection X-Ray Fluorescence Spectrometry after Preconcentration with Ammonium Pyrrolidinedithiocarbamate.
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- XRS: X-ray Spectrometry, 1997, v. 26, n. 4, p. 232, doi. 10.1002/(SICI)1097-4539(199707)26:4<232::AID-XRS250>3.0.CO;2-J
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Simple Methods for Quantitative X-Ray Fluorescence Analysis of Ancient Metal Objects of Archaeological Interest.
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- XRS: X-ray Spectrometry, 1997, v. 26, n. 4, p. 211, doi. 10.1002/(SICI)1097-4539(199707)26:4<211::AID-XRS214>3.0.CO;2-G
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Guest Editorial.
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- XRS: X-ray Spectrometry, 1997, v. 26, n. 4, p. 146, doi. 10.1002/(SICI)1097-4539(199707)26:4<146::AID-XRS225>3.0.CO;2-Y
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