Masthead.
- Published in:
- XRS: X-ray Spectrometry, 1994, v. 23, n. 1, p. fmi, doi. 10.1002/xrs.1300230101
- Publication type:
- Article
Works matching IS 00498246 AND DT 1994 AND VI 23 AND IP 1
Results: 12
1
2
Anomalous X-ray absorption of the Mα lines in the rare earth elements.
- Published in:
- XRS: X-ray Spectrometry, 1994, v. 23, n. 1, p. 19, doi. 10.1002/xrs.1300230105
- By:
- Publication type:
- Article
3
Forthcoming meetings and events.
- Published in:
- XRS: X-ray Spectrometry, 1994, v. 23, n. 1, p. 49, doi. 10.1002/xrs.1300230112
- Publication type:
- Article
4
Energy-dispersive XRF analysis of pure element intensities from their oxides using a Cd-109 source.
- Published in:
- XRS: X-ray Spectrometry, 1994, v. 23, n. 1, p. 40, doi. 10.1002/xrs.1300230109
- By:
- Publication type:
- Article
5
News.
- Published in:
- XRS: X-ray Spectrometry, 1994, v. 23, n. 1, p. 47, doi. 10.1002/xrs.1300230111
- Publication type:
- Article
6
Bent and flat highly oriented pyrolytic graphite crystals as small bragg angle monochromators in thin-specimen energy-dispersive XRF analysis.
- Published in:
- XRS: X-ray Spectrometry, 1994, v. 23, n. 1, p. 7, doi. 10.1002/xrs.1300230104
- By:
- Publication type:
- Article
7
X-Ray fluorescence analysis with elements having overlapped lines.
- Published in:
- XRS: X-ray Spectrometry, 1994, v. 23, n. 1, p. 36, doi. 10.1002/xrs.1300230108
- By:
- Publication type:
- Article
8
Handbook of X-Ray Spectrometry: Methods and Techniques Edited by: Rene E. Van Grieken and Andrzej A. Markowicz Published by Marcel Dekker, Inc., New York, 1993; xiv + 704 pp., $195, ISBN 0-8247-8483-9.
- Published in:
- XRS: X-ray Spectrometry, 1994, v. 23, n. 1, p. 45, doi. 10.1002/xrs.1300230110
- By:
- Publication type:
- Article
9
Chemical characterization of environmental particulate matter using synchrotron radiation.
- Published in:
- XRS: X-ray Spectrometry, 1994, v. 23, n. 1, p. 3, doi. 10.1002/xrs.1300230103
- By:
- Publication type:
- Article
10
Lowering the limits of detection of X-ray fluorescence analysis in the electron microscope.
- Published in:
- XRS: X-ray Spectrometry, 1994, v. 23, n. 1, p. 32, doi. 10.1002/xrs.1300230107
- By:
- Publication type:
- Article
11
From the editor.
- Published in:
- XRS: X-ray Spectrometry, 1994, v. 23, n. 1, p. 1, doi. 10.1002/xrs.1300230102
- By:
- Publication type:
- Article
12
Simultaneous matrix and background correction method and its application in XRF concentration determination of trace elements in geological materials.
- Published in:
- XRS: X-ray Spectrometry, 1994, v. 23, n. 1, p. 27, doi. 10.1002/xrs.1300230106
- By:
- Publication type:
- Article