Works matching IS 00498246 AND DT 1993 AND VI 22 AND IP 2
Results: 15
X-ray fluorescence line intensity expressions for the real divergence beam of an x-ray tube.
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- XRS: X-ray Spectrometry, 1993, v. 22, n. 2, p. 103, doi. 10.1002/xrs.1300220210
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Coded imaging x-ray microprobe.
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- XRS: X-ray Spectrometry, 1993, v. 22, n. 2, p. 65, doi. 10.1002/xrs.1300220203
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Announcements.
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- XRS: X-ray Spectrometry, 1993, v. 22, n. 2, p. 121, doi. 10.1002/xrs.1300220214
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Determination of ωγ using the tilt of the propagation plane.
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- XRS: X-ray Spectrometry, 1993, v. 22, n. 2, p. 89, doi. 10.1002/xrs.1300220207
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From the Editor.
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- XRS: X-ray Spectrometry, 1993, v. 22, n. 2, p. 63, doi. 10.1002/xrs.1300220202
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Structural and Chemical Analysis of Materials: X-ray, Electron and Neutron Diffraction, X-ray, Electron and Ion Spectrometry, Electron Microscopy. J. P. Eberhart Published by John Wiley & Sons Ltd, Chichester, 1991; 545 pages; ISBN 0 471 92977 8.
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- XRS: X-ray Spectrometry, 1993, v. 22, n. 2, p. 119, doi. 10.1002/xrs.1300220213
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Determination of nearest neighbour distances of some nickel systems from XANES.
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- XRS: X-ray Spectrometry, 1993, v. 22, n. 2, p. 86, doi. 10.1002/xrs.1300220206
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Masthead.
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- XRS: X-ray Spectrometry, 1993, v. 22, n. 2, p. fmi, doi. 10.1002/xrs.1300220201
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Application of a new treated LiF200 crystal to x-ray fluorescence analysis of geological samples.
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- XRS: X-ray Spectrometry, 1993, v. 22, n. 2, p. 114, doi. 10.1002/xrs.1300220212
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The fundamental parameter method for energy-dispersive x-ray fluorescence analysis of intermediate thickness samples with the use of monochromatic excitation.
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- XRS: X-ray Spectrometry, 1993, v. 22, n. 2, p. 80, doi. 10.1002/xrs.1300220205
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Problems of automated qualitative x-ray fluorescence analysis 3-element selection.
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- XRS: X-ray Spectrometry, 1993, v. 22, n. 2, p. 97, doi. 10.1002/xrs.1300220209
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X-ray absorption near-edge study of some rare earth complexes.
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- XRS: X-ray Spectrometry, 1993, v. 22, n. 2, p. 109, doi. 10.1002/xrs.1300220211
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A low dilution fusion technique for the analysis of geological samples. 2-major and minor element analysis and the use of influence/alpha coefficients.
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- XRS: X-ray Spectrometry, 1993, v. 22, n. 2, p. 71, doi. 10.1002/xrs.1300220204
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Forthcoming meetings and events.
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- XRS: X-ray Spectrometry, 1993, v. 22, n. 2, p. 122, doi. 10.1002/xrs.1300220215
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- Article
Sample transparency effects in tin determination by x-ray fluorescence.
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- XRS: X-ray Spectrometry, 1993, v. 22, n. 2, p. 92, doi. 10.1002/xrs.1300220208
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