Works matching IS 00498246 AND DT 1992 AND VI 21 AND IP 5
Results: 15
Background correction procedure for multi-channel x-ray fluorescence spectrometers.
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- XRS: X-ray Spectrometry, 1992, v. 21, n. 5, p. 253, doi. 10.1002/xrs.1300210511
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Determination of impurities in nuclear-grade uranium compounds by x-ray fluorescence spectrometry.
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- XRS: X-ray Spectrometry, 1992, v. 21, n. 5, p. 211, doi. 10.1002/xrs.1300210504
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Free lime determination in clinker using the ARL 8600S total cement analyzer.
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- XRS: X-ray Spectrometry, 1992, v. 21, n. 5, p. i, doi. 10.1002/xrs.1300210515
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Kβ/Kα ratios and chemical effects in partially filled 3d-shell elements.
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- XRS: X-ray Spectrometry, 1992, v. 21, n. 5, p. 239, doi. 10.1002/xrs.1300210508
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- Article
Characterization of an x-ray source for the fundamental parameter method.
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- XRS: X-ray Spectrometry, 1992, v. 21, n. 5, p. 249, doi. 10.1002/xrs.1300210510
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- Article
Henry Chessin.
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- XRS: X-ray Spectrometry, 1992, v. 21, n. 5, p. 210, doi. 10.1002/xrs.1300210503
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Forthcoming meetings and events.
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- XRS: X-ray Spectrometry, 1992, v. 21, n. 5, p. 260, doi. 10.1002/xrs.1300210514
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- Article
Accurate description of surface ionization in electron probe microanalysis: An improved formulation.
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- XRS: X-ray Spectrometry, 1992, v. 21, n. 5, p. 229, doi. 10.1002/xrs.1300210507
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From the editor.
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- XRS: X-ray Spectrometry, 1992, v. 21, n. 5, p. 209, doi. 10.1002/xrs.1300210502
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Recently accepted papers.
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- XRS: X-ray Spectrometry, 1992, v. 21, n. 5, p. 259, doi. 10.1002/xrs.1300210513
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- Article
Lorentzian contributions to x-ray lineshapes in Si(Li) spectroscopy.
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- XRS: X-ray Spectrometry, 1992, v. 21, n. 5, p. 223, doi. 10.1002/xrs.1300210506
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Masthead.
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- XRS: X-ray Spectrometry, 1992, v. 21, n. 5, p. fmi, doi. 10.1002/xrs.1300210501
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- Article
Announcements.
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- XRS: X-ray Spectrometry, 1992, v. 21, n. 5, p. 259, doi. 10.1002/xrs.1300210512
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- Article
Absorption correction in electron probe microanalysis.
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- XRS: X-ray Spectrometry, 1992, v. 21, n. 5, p. 215, doi. 10.1002/xrs.1300210505
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- Article
Validity of a simple approximation for enhancement calculations.
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- XRS: X-ray Spectrometry, 1992, v. 21, n. 5, p. 245, doi. 10.1002/xrs.1300210509
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- Article