From the editor.
- Published in:
- XRS: X-ray Spectrometry, 1991, v. 20, n. 4, p. 161, doi. 10.1002/xrs.1300200402
- By:
- Publication type:
- Article
Works matching IS 00498246 AND DT 1991 AND VI 20 AND IP 4
Results: 12
1
2
Energy-dispersive x-ray fluorescence analysis of geological materials in borax beads using Tertian's binary coefficient approach combined with internal standard addition.
- Published in:
- XRS: X-ray Spectrometry, 1991, v. 20, n. 4, p. 179, doi. 10.1002/xrs.1300200406
- By:
- Publication type:
- Article
3
Masthead.
- Published in:
- XRS: X-ray Spectrometry, 1991, v. 20, n. 4, p. fmi, doi. 10.1002/xrs.1300200401
- Publication type:
- Article
4
Forthcoming meetings and conferences.
- Published in:
- XRS: X-ray Spectrometry, 1991, v. 20, n. 4, p. 211, doi. 10.1002/xrs.1300200412
- Publication type:
- Article
5
Energy-dispersive x-ray fluorescence analysis of borax beads using double dilution without comparison standards.
- Published in:
- XRS: X-ray Spectrometry, 1991, v. 20, n. 4, p. 175, doi. 10.1002/xrs.1300200405
- By:
- Publication type:
- Article
6
Application of x-ray fluorescence spectrometry in process control in sinter plants.
- Published in:
- XRS: X-ray Spectrometry, 1991, v. 20, n. 4, p. 199, doi. 10.1002/xrs.1300200409
- By:
- Publication type:
- Article
7
Announcements.
- Published in:
- XRS: X-ray Spectrometry, 1991, v. 20, n. 4, p. 210, doi. 10.1002/xrs.1300200411
- Publication type:
- Article
8
Anomalies in the electron probe microanalysis of Y.
- Published in:
- XRS: X-ray Spectrometry, 1991, v. 20, n. 4, p. 171, doi. 10.1002/xrs.1300200404
- By:
- Publication type:
- Article
9
Improved model for the intensity of low-energy tailing in Si(Li) x-ray spectra.
- Published in:
- XRS: X-ray Spectrometry, 1991, v. 20, n. 4, p. 191, doi. 10.1002/xrs.1300200408
- By:
- Publication type:
- Article
10
X-ray fluorescence analysis of tree rings.
- Published in:
- XRS: X-ray Spectrometry, 1991, v. 20, n. 4, p. 203, doi. 10.1002/xrs.1300200410
- By:
- Publication type:
- Article
11
Dependence of XRF intensity on the tilt of the propagation plane: Experimental.
- Published in:
- XRS: X-ray Spectrometry, 1991, v. 20, n. 4, p. 163, doi. 10.1002/xrs.1300200403
- By:
- Publication type:
- Article
12
Wavelength dispersion in one-crystal and two-crystal x-ray spectrometry. A general treatment.
- Published in:
- XRS: X-ray Spectrometry, 1991, v. 20, n. 4, p. 185, doi. 10.1002/xrs.1300200407
- By:
- Publication type:
- Article