Works matching IS 00498246 AND DT 1990 AND VI 19 AND IP 5
Results: 11
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- XRS: X-ray Spectrometry, 1990, v. 19, n. 5, p. 233, doi. 10.1002/xrs.1300190506
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Masthead.
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- XRS: X-ray Spectrometry, 1990, v. 19, n. 5, p. fmi, doi. 10.1002/xrs.1300190501
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Rapid analysis of coal fly ash by x-ray fluorescence spectrometry.
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- XRS: X-ray Spectrometry, 1990, v. 19, n. 5, p. 227, doi. 10.1002/xrs.1300190505
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X-ray fluorescence analysis in the geological sciences-advances in methodology. Geological Association of Canada Short Course Vol. 7 GAC-MAC Annual Meeting, Montreal, Quebec, 13-14 May 1989. Edited by S. T. AHMEDALI, with contributions from S. ABBEY, F. CLAISSE, P. J. HARVEY, V. KOCMAN, G. R. LACHANCE, R. M. ROUSSEAU and J. P. WILLIS. ISBN 0-919216-38-2. No. of pages: 297 (1989). Price: $25.00 (CDN) for members, $35.000 (CDN) for non-members, plus P&H $3.50 in Canada, $5.00 elsewhere
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- XRS: X-ray Spectrometry, 1990, v. 19, n. 5, p. 247, doi. 10.1002/xrs.1300190509
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Announcements.
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- XRS: X-ray Spectrometry, 1990, v. 19, n. 5, p. 250, doi. 10.1002/xrs.1300190511
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Calibration of analytical spectrometers and metrological aims of quantitative analysis.
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- XRS: X-ray Spectrometry, 1990, v. 19, n. 5, p. 219, doi. 10.1002/xrs.1300190504
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Structural studies of glassy semiconducting Se.
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- XRS: X-ray Spectrometry, 1990, v. 19, n. 5, p. 243, doi. 10.1002/xrs.1300190508
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Forthcoming meetings and conferences.
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- XRS: X-ray Spectrometry, 1990, v. 19, n. 5, p. 249, doi. 10.1002/xrs.1300190510
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- Article
Quantitative XRF analysis of surface layers: Procedure for the determination of thickness and composition.
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- XRS: X-ray Spectrometry, 1990, v. 19, n. 5, p. 211, doi. 10.1002/xrs.1300190503
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A matrix effect correction algorithm for x-ray fluorescence analysis of steel.
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- XRS: X-ray Spectrometry, 1990, v. 19, n. 5, p. 237, doi. 10.1002/xrs.1300190507
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From the editor.
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- XRS: X-ray Spectrometry, 1990, v. 19, n. 5, p. 209, doi. 10.1002/xrs.1300190502
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