Works matching IS 00498246 AND DT 1990 AND VI 19 AND IP 5
1
- XRS: X-ray Spectrometry, 1990, v. 19, n. 5, p. 233, doi. 10.1002/xrs.1300190506
- Tan, M.;
- Sahin, Y.;
- Saplakǧlu, A.
- Article
2
- XRS: X-ray Spectrometry, 1990, v. 19, n. 5, p. fmi, doi. 10.1002/xrs.1300190501
- Article
3
- XRS: X-ray Spectrometry, 1990, v. 19, n. 5, p. 227, doi. 10.1002/xrs.1300190505
- Article
4
- XRS: X-ray Spectrometry, 1990, v. 19, n. 5, p. 247, doi. 10.1002/xrs.1300190509
- Article
5
- XRS: X-ray Spectrometry, 1990, v. 19, n. 5, p. 250, doi. 10.1002/xrs.1300190511
- Article
6
- XRS: X-ray Spectrometry, 1990, v. 19, n. 5, p. 219, doi. 10.1002/xrs.1300190504
- Article
7
- XRS: X-ray Spectrometry, 1990, v. 19, n. 5, p. 243, doi. 10.1002/xrs.1300190508
- Kumar, Arvind;
- Husain, M.;
- Swarup, S.;
- Nigam, A. N.;
- Kumar, A.
- Article
8
- XRS: X-ray Spectrometry, 1990, v. 19, n. 5, p. 249, doi. 10.1002/xrs.1300190510
- Article
9
- XRS: X-ray Spectrometry, 1990, v. 19, n. 5, p. 211, doi. 10.1002/xrs.1300190503
- Rössiger, V.;
- Thomas, H.-J.
- Article
10
- XRS: X-ray Spectrometry, 1990, v. 19, n. 5, p. 237, doi. 10.1002/xrs.1300190507
- Gunicheva, T. N.;
- Finkelshtein, A. L.;
- Afonin, V. P.
- Article
11
- XRS: X-ray Spectrometry, 1990, v. 19, n. 5, p. 209, doi. 10.1002/xrs.1300190502
- Article