Works matching IS 00498246 AND DT 1990 AND VI 19 AND IP 2

Results: 13

XRF procedures for analysis of standard reference materials.

Published in:

XRS: X-ray Spectrometry, 1990, v. 19, n. 2, p. 85, doi. 10.1002/xrs.1300190211

By:

Tao, Guang Yi;
Zhang, Zhong Yi;
Ji, An

Publication type:

Article

New horizons in x-ray fluorescence analysis.

Published in:

XRS: X-ray Spectrometry, 1990, v. 19, n. 2, p. 45, doi. 10.1002/xrs.1300190204

By:

Gilfrich, John V.

Publication type:

Article

XRS analysis of sulphides by fusion methods.

Published in:

XRS: X-ray Spectrometry, 1990, v. 19, n. 2, p. 67, doi. 10.1002/xrs.1300190208

By:

Norrish, K.;
Thompson, G. M.

Publication type:

Article

Characterization of II-VI semiconductor compounds grown by metallo-organic chemical vapour deposition.

Published in:

XRS: X-ray Spectrometry, 1990, v. 19, n. 2, p. 79, doi. 10.1002/xrs.1300190210

By:

Christiansz, G. I.;
Georgiou, S.;
Kwietniak, M. S.;
Pain, G. N.;
Usher, B.;
Warminski, T.;
Glanvill, S. R.;
Rossouw, C. J.;
Stevenson, A. W.;
Wilkins, S. W.;
Wielunski, L.

Publication type:

Article

Guest editorial.

Published in:

XRS: X-ray Spectrometry, 1990, v. 19, n. 2, p. 43, doi. 10.1002/xrs.1300190203

By:

O'connor, Brian

Publication type:

Article

Determination of forms of sulphur in plant material by x-ray fluorescence spectrometry.

Published in:

XRS: X-ray Spectrometry, 1990, v. 19, n. 2, p. 63, doi. 10.1002/xrs.1300190207

By:

Pinkerton, A.;
Norrish, K.;
Randall, P. J.

Publication type:

Article

From the editor.

Published in:

XRS: X-ray Spectrometry, 1990, v. 19, n. 2, p. 41, doi. 10.1002/xrs.1300190202

By:

Gilfrich, John

Publication type:

Article

Announcements.

Published in:: XRS: X-ray Spectrometry, 1990, v. 19, n. 2, p. 90, doi. 10.1002/xrs.1300190213
Publication type:: Article

Holes in the background in XRS.

Published in:

XRS: X-ray Spectrometry, 1990, v. 19, n. 2, p. 59, doi. 10.1002/xrs.1300190206

By:

Self, P. G.;
Norrish, K.;
Milnes, A. R.;
Graham, J.;
Robinson, B.

Publication type:

Article

Masthead.

Published in:: XRS: X-ray Spectrometry, 1990, v. 19, n. 2, p. fmi, doi. 10.1002/xrs.1300190201
Publication type:: Article

Forthcoming meetings and conferences.

Published in:: XRS: X-ray Spectrometry, 1990, v. 19, n. 2, p. 89, doi. 10.1002/xrs.1300190212
Publication type:: Article

Recent results using synchrotron radiation for energy-dispersive x-ray fluorescence analysis.

Published in:

XRS: X-ray Spectrometry, 1990, v. 19, n. 2, p. 53, doi. 10.1002/xrs.1300190205

By:

Jaklevic, J. M.;
Giauque, R. D.;
Thompson, A. C.

Publication type:

Article

Characterization of II-VI semiconductor materials using surface analytical techniques.

Published in:

XRS: X-ray Spectrometry, 1990, v. 19, n. 2, p. 73, doi. 10.1002/xrs.1300190209

By:

Kibel, Martyn H.

Publication type:

Article