Works matching IS 00498246 AND DT 1990 AND VI 19 AND IP 1
1
- XRS: X-ray Spectrometry, 1990, v. 19, n. 1, p. 1, doi. 10.1002/xrs.1300190102
- Article
2
- XRS: X-ray Spectrometry, 1990, v. 19, n. 1, p. 27, doi. 10.1002/xrs.1300190106
- Kumar, Arvind;
- Husain, M.;
- Swarup, S.;
- Nigam, A. N.;
- Kumar, A.
- Article
3
- XRS: X-ray Spectrometry, 1990, v. 19, n. 1, p. fmi, doi. 10.1002/xrs.1300190101
- Article
4
- XRS: X-ray Spectrometry, 1990, v. 19, n. 1, p. 23, doi. 10.1002/xrs.1300190105
- Raghavaiah, C. V.;
- Rao, N. Venkateswara;
- Reddy, S. Bhuloka;
- Satyanarayana, G.;
- Murty, G. Sree Krishna;
- Rao, M. V. S. Chandrasekhar;
- Sastry, D. L.
- Article
5
- XRS: X-ray Spectrometry, 1990, v. 19, n. 1, p. 39, doi. 10.1002/xrs.1300190109
- Article
6
- XRS: X-ray Spectrometry, 1990, v. 19, n. 1, p. 35, doi. 10.1002/xrs.1300190108
- Short, M. A.;
- Fallon, M. R.
- Article
7
- XRS: X-ray Spectrometry, 1990, v. 19, n. 1, p. 40, doi. 10.1002/xrs.1300190110
- Article
8
- XRS: X-ray Spectrometry, 1990, v. 19, n. 1, p. 3, doi. 10.1002/xrs.1300190103
- Eastell, J.;
- Willis, J. P.
- Article
9
- XRS: X-ray Spectrometry, 1990, v. 19, n. 1, p. 29, doi. 10.1002/xrs.1300190107
- Araújo, M. Fátima;
- Van Espen, P.;
- Van Grieken, R.
- Article
10
- XRS: X-ray Spectrometry, 1990, v. 19, n. 1, p. 15, doi. 10.1002/xrs.1300190104
- Okamoto, Tokuhiko;
- Yamashita, Seiichi;
- Yamaguchi, Toshio;
- Wakita, Hisanobu
- Article