Works matching IS 00498246 AND DT 1990 AND VI 19 AND IP 1
Results: 10
From the editor.
- Published in:
- XRS: X-ray Spectrometry, 1990, v. 19, n. 1, p. 1, doi. 10.1002/xrs.1300190102
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Study of K-absorption edge of selenium in the glassy semiconducting Se.
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- XRS: X-ray Spectrometry, 1990, v. 19, n. 1, p. 27, doi. 10.1002/xrs.1300190106
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Masthead.
- Published in:
- XRS: X-ray Spectrometry, 1990, v. 19, n. 1, p. fmi, doi. 10.1002/xrs.1300190101
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- Article
L α/L β; and L α/L γ x-ray intensity ratios for elements in the range Z = 55-80.
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- XRS: X-ray Spectrometry, 1990, v. 19, n. 1, p. 23, doi. 10.1002/xrs.1300190105
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Announcements.
- Published in:
- XRS: X-ray Spectrometry, 1990, v. 19, n. 1, p. 39, doi. 10.1002/xrs.1300190109
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- Article
EXAFS measurement with laboratory equipment: Problems and their countermeasures.
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- XRS: X-ray Spectrometry, 1990, v. 19, n. 1, p. 15, doi. 10.1002/xrs.1300190104
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- Article
Diffraction of a high-energy characteristic x-ray by a perfect crystal.
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- XRS: X-ray Spectrometry, 1990, v. 19, n. 1, p. 35, doi. 10.1002/xrs.1300190108
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- Article
Forthcoming meetings and conferences.
- Published in:
- XRS: X-ray Spectrometry, 1990, v. 19, n. 1, p. 40, doi. 10.1002/xrs.1300190110
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- Article
A low dilution fusion technique for the analysis of geological samples 1-method and trace element analysis.
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- XRS: X-ray Spectrometry, 1990, v. 19, n. 1, p. 3, doi. 10.1002/xrs.1300190103
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- Publication type:
- Article
Determination of sample thickness via scattered radiation in x-ray fluorescence spectrometry with filtered continuum excitation.
- Published in:
- XRS: X-ray Spectrometry, 1990, v. 19, n. 1, p. 29, doi. 10.1002/xrs.1300190107
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- Article