Works matching IS 00498246 AND DT 1989 AND VI 18 AND IP 6
1
- XRS: X-ray Spectrometry, 1989, v. 18, n. 6, p. 271, doi. 10.1002/xrs.1300180607
- Article
2
- XRS: X-ray Spectrometry, 1989, v. 18, n. 6, p. 251, doi. 10.1002/xrs.1300180602
- Article
3
- XRS: X-ray Spectrometry, 1989, v. 18, n. 6, p. 267, doi. 10.1002/xrs.1300180606
- Article
4
- XRS: X-ray Spectrometry, 1989, v. 18, n. 6, p. fmi, doi. 10.1002/xrs.1300180601
- Article
5
- XRS: X-ray Spectrometry, 1989, v. 18, n. 6, p. 263, doi. 10.1002/xrs.1300180605
- Article
6
- XRS: X-ray Spectrometry, 1989, v. 18, n. 6, p. 291, doi. 10.1002/xrs.1300180609
- Article
7
- XRS: X-ray Spectrometry, 1989, v. 18, n. 6, p. 259, doi. 10.1002/xrs.1300180604
- Muia, L. M.;
- Van Grieken, R.
- Article
8
- XRS: X-ray Spectrometry, 1989, v. 18, n. 6, p. 281, doi. 10.1002/xrs.1300180608
- Fernandez, Jorge E.;
- Rubio, Marcel0
- Article
9
- XRS: X-ray Spectrometry, 1989, v. 18, n. 6, p. 292, doi. 10.1002/xrs.1300180610
- Article
10
- XRS: X-ray Spectrometry, 1989, v. 18, n. 6, p. 253, doi. 10.1002/xrs.1300180603
- Article