Works matching IS 00498246 AND DT 1988 AND VI 17 AND IP 5
1
- XRS: X-ray Spectrometry, 1988, v. 17, n. 5, p. 201, doi. 10.1002/xrs.1300170509
- Article
2
- XRS: X-ray Spectrometry, 1988, v. 17, n. 5, p. 175, doi. 10.1002/xrs.1300170504
- Smagunova, A. N.;
- Molchanova, E. I.;
- Pliner, L. N.;
- Finkelshtein, A. L.
- Article
3
- XRS: X-ray Spectrometry, 1988, v. 17, n. 5, p. 195, doi. 10.1002/xrs.1300170508
- Eddy, B. T.;
- Balaes, A. M. E.
- Article
4
- XRS: X-ray Spectrometry, 1988, v. 17, n. 5, p. 171, doi. 10.1002/xrs.1300170503
- Yap, C. T.;
- Ayala, R. E.;
- Wobrauschek, P.
- Article
5
- XRS: X-ray Spectrometry, 1988, v. 17, n. 5, p. 189, doi. 10.1002/xrs.1300170507
- Article
6
- XRS: X-ray Spectrometry, 1988, v. 17, n. 5, p. 169, doi. 10.1002/xrs.1300170502
- Article
7
- XRS: X-ray Spectrometry, 1988, v. 17, n. 5, p. 187, doi. 10.1002/xrs.1300170506
- Article
8
- XRS: X-ray Spectrometry, 1988, v. 17, n. 5, p. fmi, doi. 10.1002/xrs.1300170501
- Article
9
- XRS: X-ray Spectrometry, 1988, v. 17, n. 5, p. 181, doi. 10.1002/xrs.1300170505
- Amritphale, S. S.;
- Patel, M.
- Article