Works matching IS 00498246 AND DT 1987 AND VI 16 AND IP 2
Results: 13
Comparison of experimental relative efficiencies for different Si(Li) detectors in the energy range, 4.5-17.5 keV.
- Published in:
- XRS: X-ray Spectrometry, 1987, v. 16, n. 2, p. 95, doi. 10.1002/xrs.1300160210
- By:
- Publication type:
- Article
X-ray fluorescence studies on low-Z elements of straits chinese porcelains using Fe-55 and Cd-109 annular sources.
- Published in:
- XRS: X-ray Spectrometry, 1987, v. 16, n. 2, p. 55, doi. 10.1002/xrs.1300160203
- By:
- Publication type:
- Article
Kβ.
- Published in:
- XRS: X-ray Spectrometry, 1987, v. 16, n. 2, p. 73, doi. 10.1002/xrs.1300160207
- By:
- Publication type:
- Article
Editorial.
- Published in:
- XRS: X-ray Spectrometry, 1987, v. 16, n. 2, p. 53, doi. 10.1002/xrs.1300160202
- By:
- Publication type:
- Article
Forthcomings meetings and conferences.
- Published in:
- XRS: X-ray Spectrometry, 1987, v. 16, n. 2, p. 100, doi. 10.1002/xrs.1300160213
- Publication type:
- Article
Die Nutzung externer Linienz-zu Untergrundverhältnisse in der quantitativen energiedispersiven Elektronenstrahl-Mikroanalyse. (Use of external peak-to-background ratios in quantitative energy-dispersive electron probe microanalysis).
- Published in:
- XRS: X-ray Spectrometry, 1987, v. 16, n. 2, p. 67, doi. 10.1002/xrs.1300160206
- By:
- Publication type:
- Article
Masthead.
- Published in:
- XRS: X-ray Spectrometry, 1987, v. 16, n. 2, p. fmi, doi. 10.1002/xrs.1300160201
- Publication type:
- Article
Forthcoming papers.
- Published in:
- XRS: X-ray Spectrometry, 1987, v. 16, n. 2, p. 99, doi. 10.1002/xrs.1300160212
- Publication type:
- Article
Analysis of fused samples using influence coefficients obtained from synthetic standards.
- Published in:
- XRS: X-ray Spectrometry, 1987, v. 16, n. 2, p. 61, doi. 10.1002/xrs.1300160205
- By:
- Publication type:
- Article
Comparison of matrix effect correction and direct intensity-concentration relationship methods for major element analysis of geological materials by X-ray fluorescence spectrometry.
- Published in:
- XRS: X-ray Spectrometry, 1987, v. 16, n. 2, p. 87, doi. 10.1002/xrs.1300160209
- By:
- Publication type:
- Article
Announcements.
- Published in:
- XRS: X-ray Spectrometry, 1987, v. 16, n. 2, p. 99, doi. 10.1002/xrs.1300160211
- Publication type:
- Article
SEM studies on silica from plant materials.
- Published in:
- XRS: X-ray Spectrometry, 1987, v. 16, n. 2, p. 57, doi. 10.1002/xrs.1300160204
- By:
- Publication type:
- Article
Effect of some important sample parameters on the X-ray fluorescence determination of impurities in pure materials: Determination of Ca, Y, Gd and Th in uranium.
- Published in:
- XRS: X-ray Spectrometry, 1987, v. 16, n. 2, p. 81, doi. 10.1002/xrs.1300160208
- By:
- Publication type:
- Article