Works matching IS 00498246 AND DT 1986 AND VI 15 AND IP 4
1
- XRS: X-ray Spectrometry, 1986, v. 15, n. 4, p. fmi, doi. 10.1002/xrs.1300150401
- Article
2
- XRS: X-ray Spectrometry, 1986, v. 15, n. 4, p. 229, doi. 10.1002/xrs.1300150402
- Article
3
- XRS: X-ray Spectrometry, 1986, v. 15, n. 4, p. 296, doi. 10.1002/xrs.1300150413
- Article
4
- XRS: X-ray Spectrometry, 1986, v. 15, n. 4, p. 245, doi. 10.1002/xrs.1300150406
- Article
5
- XRS: X-ray Spectrometry, 1986, v. 15, n. 4, p. 289, doi. 10.1002/xrs.1300150412
- Tang, S. M.;
- Kump, P.;
- Yap, C. T.;
- Bilal, M. G.
- Article
6
- XRS: X-ray Spectrometry, 1986, v. 15, n. 4, p. 241, doi. 10.1002/xrs.1300150405
- Article
7
- XRS: X-ray Spectrometry, 1986, v. 15, n. 4, p. 267, doi. 10.1002/xrs.1300150409
- O'Connor, B. H.;
- Chang, W-J.
- Article
8
- XRS: X-ray Spectrometry, 1986, v. 15, n. 4, p. 296, doi. 10.1002/xrs.1300150414
- Article
9
- XRS: X-ray Spectrometry, 1986, v. 15, n. 4, p. 251, doi. 10.1002/xrs.1300150407
- Pella, P. A.;
- Tao, G. Y.;
- Lachance, G.
- Article
10
- XRS: X-ray Spectrometry, 1986, v. 15, n. 4, p. 287, doi. 10.1002/xrs.1300150411
- Sieber, John R.;
- Pella, Peter A.
- Article
11
- XRS: X-ray Spectrometry, 1986, v. 15, n. 4, p. 271, doi. 10.1002/xrs.1300150410
- Article
12
- XRS: X-ray Spectrometry, 1986, v. 15, n. 4, p. 231, doi. 10.1002/xrs.1300150403
- Van Dyck, Peter;
- Török, Szabina;
- Van Grieken, René
- Article
13
- XRS: X-ray Spectrometry, 1986, v. 15, n. 4, p. 239, doi. 10.1002/xrs.1300150404
- Chattopadhyay, S.;
- Mande, C.;
- Juneja, H. D.;
- Munshi, K. N.
- Article
14
- XRS: X-ray Spectrometry, 1986, v. 15, n. 4, p. 259, doi. 10.1002/xrs.1300150408
- Yacout, A. M.;
- Verghese, K.;
- Gardner, R. P.
- Article