Thin-film thickness calculation to maximize X-ray fluorescence intensity in transmission arrangements.
- Published in:
- XRS: X-ray Spectrometry, 1986, v. 15, n. 2, p. 103, doi. 10.1002/xrs.1300150206
- By:
- Publication type:
- Article
Works matching IS 00498246 AND DT 1986 AND VI 15 AND IP 2
Results: 17
1
2
News.
- Published in:
- XRS: X-ray Spectrometry, 1986, v. 15, n. 2, p. 151, doi. 10.1002/xrs.1300150214
- Publication type:
- Article
3
Dependence of the K X-ray yield on target thickness in the S + Ge collision system.
- Published in:
- XRS: X-ray Spectrometry, 1986, v. 15, n. 2, p. 107, doi. 10.1002/xrs.1300150207
- By:
- Publication type:
- Article
4
Editorial.
- Published in:
- XRS: X-ray Spectrometry, 1986, v. 15, n. 2, p. 81, doi. 10.1002/xrs.1300150202
- By:
- Publication type:
- Article
5
Quantitative electron probe microanalysis of carbon in binary carbides. II.
- Published in:
- XRS: X-ray Spectrometry, 1986, v. 15, n. 2, p. 143, doi. 10.1002/xrs.1300150213
- By:
- Publication type:
- Article
6
Forthcoming meetings & conferences.
- Published in:
- XRS: X-ray Spectrometry, 1986, v. 15, n. 2, p. 152, doi. 10.1002/xrs.1300150217
- Publication type:
- Article
7
Masthead.
- Published in:
- XRS: X-ray Spectrometry, 1986, v. 15, n. 2, p. fmi, doi. 10.1002/xrs.1300150201
- Publication type:
- Article
8
Wavelength-dispersive X-ray fluorescence spectrometric technique for determining major and minor elements in columbite-tantalite using a rhodium excitation source.
- Published in:
- XRS: X-ray Spectrometry, 1986, v. 15, n. 2, p. 95, doi. 10.1002/xrs.1300150205
- By:
- Publication type:
- Article
9
Quantitative electron probe microanalysis of carbon in binary carbides. I-principles and procedures.
- Published in:
- XRS: X-ray Spectrometry, 1986, v. 15, n. 2, p. 135, doi. 10.1002/xrs.1300150212
- By:
- Publication type:
- Article
10
Forthcoming papers.
- Published in:
- XRS: X-ray Spectrometry, 1986, v. 15, n. 2, p. 152, doi. 10.1002/xrs.1300150216
- Publication type:
- Article
11
A simple absorption correction for electron probe X-ray microanalysis of bulk samples.
- Published in:
- XRS: X-ray Spectrometry, 1986, v. 15, n. 2, p. 115, doi. 10.1002/xrs.1300150209
- By:
- Publication type:
- Article
12
Evaluation of an equation for bremsstrahlung background in electron-probe X-ray microanalysis of composite samples.
- Published in:
- XRS: X-ray Spectrometry, 1986, v. 15, n. 2, p. 131, doi. 10.1002/xrs.1300150211
- By:
- Publication type:
- Article
13
Limiting values of matrix effects in XRF analysis and some of its consequences.
- Published in:
- XRS: X-ray Spectrometry, 1986, v. 15, n. 2, p. 87, doi. 10.1002/xrs.1300150204
- By:
- Publication type:
- Article
14
Announcement/notification.
- Published in:
- XRS: X-ray Spectrometry, 1986, v. 15, n. 2, p. 151, doi. 10.1002/xrs.1300150215
- Publication type:
- Article
15
X-ray K absorption spectra of copper in its soaps and their liquid crystalline solutions in benzene.
- Published in:
- XRS: X-ray Spectrometry, 1986, v. 15, n. 2, p. 111, doi. 10.1002/xrs.1300150208
- By:
- Publication type:
- Article
16
Quantitative X-ray microanalysis of thin foils in STEM.
- Published in:
- XRS: X-ray Spectrometry, 1986, v. 15, n. 2, p. 121, doi. 10.1002/xrs.1300150210
- By:
- Publication type:
- Article
17
Sample homogeneity in energy-dispersive XRF trace metal analysis.
- Published in:
- XRS: X-ray Spectrometry, 1986, v. 15, n. 2, p. 83, doi. 10.1002/xrs.1300150203
- By:
- Publication type:
- Article