Works matching IS 00498246 AND DT 1985 AND VI 14 AND IP 3
1
- XRS: X-ray Spectrometry, 1985, v. 14, n. 3, p. 109, doi. 10.1002/xrs.1300140304
- Article
2
- XRS: X-ray Spectrometry, 1985, v. 14, n. 3, p. 139, doi. 10.1002/xrs.1300140308
- Bloomfield, D. J.;
- Love, G.;
- Scott, V. D.
- Article
3
- XRS: X-ray Spectrometry, 1985, v. 14, n. 3, p. 102, doi. 10.1002/xrs.1300140303
- Purdue, G. E.;
- Williams, R. W.
- Article
4
- XRS: X-ray Spectrometry, 1985, v. 14, n. 3, p. 136, doi. 10.1002/xrs.1300140307
- Nigam, Amar Nath;
- Rajput, Om Prakash;
- Srivastava, B. D.
- Article
5
- XRS: X-ray Spectrometry, 1985, v. 14, n. 3, p. 101, doi. 10.1002/xrs.1300140302
- Article
6
- XRS: X-ray Spectrometry, 1985, v. 14, n. 3, p. 125, doi. 10.1002/xrs.1300140306
- Pella, P. A.;
- Feng, Liangyuan;
- Small, J. A.
- Article
7
- XRS: X-ray Spectrometry, 1985, v. 14, n. 3, p. fmi, doi. 10.1002/xrs.1300140301
- Article
8
- XRS: X-ray Spectrometry, 1985, v. 14, n. 3, p. 120, doi. 10.1002/xrs.1300140305
- Poehn, Christian;
- Wernisch, Johann;
- Hanke, Wolfgang
- Article
9
- XRS: X-ray Spectrometry, 1985, v. 14, n. 3, p. 149, doi. 10.1002/xrs.1300140309
- Article