Works matching IS 00498246 AND DT 1982 AND VI 11 AND IP 2
Results: 16
Editorial.
- Published in:
- XRS: X-ray Spectrometry, 1982, v. 11, n. 2, p. 41, doi. 10.1002/xrs.1300110202
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- Article
Product news.
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- XRS: X-ray Spectrometry, 1982, v. 11, n. 2, p. ix, doi. 10.1002/xrs.1300110216
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- Article
Influence of interelement effects on x-ray fluorescence calibration curve coefficients for binary mixtures.
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- XRS: X-ray Spectrometry, 1982, v. 11, n. 2, p. 70, doi. 10.1002/xrs.1300110209
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Masthead.
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- XRS: X-ray Spectrometry, 1982, v. 11, n. 2, p. fmi, doi. 10.1002/xrs.1300110201
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- Article
A modified background-ratio method for x-ray fluorescence analysis of soil and plant materials.
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- XRS: X-ray Spectrometry, 1982, v. 11, n. 2, p. 89, doi. 10.1002/xrs.1300110212
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- Article
X-ray fluorescence analysis of silver and palladium film thicknesses on silicon solar cells.
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- XRS: X-ray Spectrometry, 1982, v. 11, n. 2, p. 51, doi. 10.1002/xrs.1300110205
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- Article
Letter to the editor.
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- XRS: X-ray Spectrometry, 1982, v. 11, n. 2, p. vii, doi. 10.1002/xrs.1300110213
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- Article
Comprehensive major and trace element analysis of geological material by x-ray fluorescence, using low dilution fusions.
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- XRS: X-ray Spectrometry, 1982, v. 11, n. 2, p. 55, doi. 10.1002/xrs.1300110206
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- Article
Automated qualitative wavelength-dispersive x-ray fluorescence analysis.
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- XRS: X-ray Spectrometry, 1982, v. 11, n. 2, p. 83, doi. 10.1002/xrs.1300110211
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- Article
Comparison of the intensity correction method and the analytical value correction method in the correction of interfering spectrum overlap.
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- XRS: X-ray Spectrometry, 1982, v. 11, n. 2, p. 46, doi. 10.1002/xrs.1300110204
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- Article
X-ray attenuation project.
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- XRS: X-ray Spectrometry, 1982, v. 11, n. 2, p. ix, doi. 10.1002/xrs.1300110215
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- Article
Energies et Probabilités de Transition des Raies X.
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- XRS: X-ray Spectrometry, 1982, v. 11, n. 2, p. 79, doi. 10.1002/xrs.1300110210
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- Article
Relative intensity factors for K, L and M shell x-ray lines.
- Published in:
- XRS: X-ray Spectrometry, 1982, v. 11, n. 2, p. 42, doi. 10.1002/xrs.1300110203
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- Article
Ron Jenkins, R. W. Gould and Dale Gedcke. Quantitative x-ray spectrometry. Marcel Dekker, New York, 1981. 586 pp. $59.50.
- Published in:
- XRS: X-ray Spectrometry, 1982, v. 11, n. 2, p. vii, doi. 10.1002/xrs.1300110214
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- Article
Analysis of finely divided metal particles formed in montmorillonite by scanning electron microscopy.
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- XRS: X-ray Spectrometry, 1982, v. 11, n. 2, p. 64, doi. 10.1002/xrs.1300110207
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A comparison of two equations used as calibration curves for ternary samples in x-ray fluorescence spectrometry.
- Published in:
- XRS: X-ray Spectrometry, 1982, v. 11, n. 2, p. 66, doi. 10.1002/xrs.1300110208
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- Article