Works matching IS 00498246 AND DT 1982 AND VI 11 AND IP 1
Results: 11
Calibration standards. The XRF standards of the iron and Steel Institute of Japan.
- Published in:
- XRS: X-ray Spectrometry, 1982, v. 11, n. 1, p. 36, doi. 10.1002/xrs.1300110111
- Publication type:
- Article
Simultaneous multielement analysis of phosphates by x-ray fluorescence.
- Published in:
- XRS: X-ray Spectrometry, 1982, v. 11, n. 1, p. 8, doi. 10.1002/xrs.1300110104
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- Publication type:
- Article
Rapid preparation of robust pressed powder briquettes containing a styrene and wax mixture as binder.
- Published in:
- XRS: X-ray Spectrometry, 1982, v. 11, n. 1, p. 29, doi. 10.1002/xrs.1300110108
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- Publication type:
- Article
Co Kα X-ray shift in Co.
- Published in:
- XRS: X-ray Spectrometry, 1982, v. 11, n. 1, p. 35, doi. 10.1002/xrs.1300110110
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- Publication type:
- Article
A simple method for calculating x-ray absorption spectra for use in crystal spectrometer and mirror analysis.
- Published in:
- XRS: X-ray Spectrometry, 1982, v. 11, n. 1, p. 2, doi. 10.1002/xrs.1300110103
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- Publication type:
- Article
An improved method of x-ray fluorescence analysis of chrome containing refractories.
- Published in:
- XRS: X-ray Spectrometry, 1982, v. 11, n. 1, p. 25, doi. 10.1002/xrs.1300110107
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- Publication type:
- Article
Editorial.
- Published in:
- XRS: X-ray Spectrometry, 1982, v. 11, n. 1, p. 1, doi. 10.1002/xrs.1300110102
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- Publication type:
- Article
Energy dispersive x-ray diffractometry: 2. Phase transformations at elevated temperatures.
- Published in:
- XRS: X-ray Spectrometry, 1982, v. 11, n. 1, p. 19, doi. 10.1002/xrs.1300110106
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- Publication type:
- Article
Masthead.
- Published in:
- XRS: X-ray Spectrometry, 1982, v. 11, n. 1, p. fmi, doi. 10.1002/xrs.1300110101
- Publication type:
- Article
Energy dispersive x-ray diffractometry: 1. The specimen transparency factor.
- Published in:
- XRS: X-ray Spectrometry, 1982, v. 11, n. 1, p. 13, doi. 10.1002/xrs.1300110105
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- Publication type:
- Article
Quantitative determination of argon in sputtered films by wavelength-dispersive electron probe microanalysis.
- Published in:
- XRS: X-ray Spectrometry, 1982, v. 11, n. 1, p. 32, doi. 10.1002/xrs.1300110109
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- Publication type:
- Article