Works matching IS 00498246 AND DT 1981 AND VI 10 AND IP 3

Results: 16

Direct determination of trace elements in coal: Wavelength-dispersive X-ray spectrometry with matrix correction using compton scattered radiation.

Published in:

XRS: X-ray Spectrometry, 1981, v. 10, n. 3, p. 131, doi. 10.1002/xrs.1300100310

By:

Mills, John C.;
Turner, K. E.;
Roller, P. W.;
Belcher, C. B.

Publication type:

Article

Standardization of the peak area ratios obtained from the analysis of small glass fragments using energy-dispersive X-ray fluorescence spectrometers.

Published in:

XRS: X-ray Spectrometry, 1981, v. 10, n. 3, p. 98, doi. 10.1002/xrs.1300100303

By:

Howden, C. R.;
Dudley, R. J.;
Smalldon, K. W.

Publication type:

Article

F. Maurice, L. Meny and R. Fixier (Editors), Microanalyse et Microscopie Electronique à Bayalage and its English translation Microanalysis and Scanning Electron Microscopy.

Published in:

XRS: X-ray Spectrometry, 1981, v. 10, n. 3, p. 153, doi. 10.1002/xrs.1300100314

By:

Brown, J.

Publication type:

Article

Fast X-ray imaging using a position sensitive proportional counter.

Published in:

XRS: X-ray Spectrometry, 1981, v. 10, n. 3, p. 117, doi. 10.1002/xrs.1300100307

By:

Gurker, N.;
Zeiner, K.

Publication type:

Article

Editorial.

Published in:

XRS: X-ray Spectrometry, 1981, v. 10, n. 3, p. 97, doi. 10.1002/xrs.1300100302

By:

Jenkins, Ron

Publication type:

Article

Letter to the editor.

Published in:

XRS: X-ray Spectrometry, 1981, v. 10, n. 3, p. 152, doi. 10.1002/xrs.1300100313

By:

Birks, L. S.

Publication type:

Article

Analyse Automatique des Spectres de Rayons-X par Dépouillement Spectral.

Published in:

XRS: X-ray Spectrometry, 1981, v. 10, n. 3, p. 113, doi. 10.1002/xrs.1300100306

By:

Lecomte, R.;
Landsberger, S.;
Paradis, P.;
Monaro, S.;
Desaulniers, G.

Publication type:

Article

Masthead.

Published in:: XRS: X-ray Spectrometry, 1981, v. 10, n. 3, p. fmi, doi. 10.1002/xrs.1300100301
Publication type:: Article

An X-ray narrow band detector and its application to X-ray spectral quantitative analysis.

Published in:

XRS: X-ray Spectrometry, 1981, v. 10, n. 3, p. 147, doi. 10.1002/xrs.1300100312

By:

Anisovich, K. V.;
Komyak, N. I.

Publication type:

Article

A computer program to evaluate a counting loss correction constant in XRF analysis.

Published in:

XRS: X-ray Spectrometry, 1981, v. 10, n. 3, p. 109, doi. 10.1002/xrs.1300100305

By:

Stecher, Ole

Publication type:

Article

Forthcoming conferences & meetings.

Published in:: XRS: X-ray Spectrometry, 1981, v. 10, n. 3, p. viii, doi. 10.1002/xrs.1300100316
Publication type:: Article

Measurement of K X-ray fluorescence cross-sections.

Published in:

XRS: X-ray Spectrometry, 1981, v. 10, n. 3, p. 128, doi. 10.1002/xrs.1300100309

By:

Bhan, Chander;
Chaturvedi, S. N.;
Nath, N.

Publication type:

Article

A Gaussian expression to describe ϕ(ρ z) curves for quantitative electron probe microanalysis.

Published in:

XRS: X-ray Spectrometry, 1981, v. 10, n. 3, p. 138, doi. 10.1002/xrs.1300100311

By:

Packwood, R. H.;
Brown, J. D.

Publication type:

Article

Comparison of the Japanese industrial standard and α-correction methods for X-ray fluorescence analysis of steels.

Published in:

XRS: X-ray Spectrometry, 1981, v. 10, n. 3, p. 103, doi. 10.1002/xrs.1300100304

By:

Ito, Minao;
Sato, Shoki;
Narita, Masanao

Publication type:

Article

Product news.

Published in:: XRS: X-ray Spectrometry, 1981, v. 10, n. 3, p. vi, doi. 10.1002/xrs.1300100315
Publication type:: Article

A correction constant for rapid microprobe analysis of multicomponent metallic systems.

Published in:

XRS: X-ray Spectrometry, 1981, v. 10, n. 3, p. 126, doi. 10.1002/xrs.1300100308

By:

Kale, G. B.;
Khera, S. K.

Publication type:

Article