Works matching IS 00498246 AND DT 1980 AND VI 9 AND IP 4
Results: 12
Analysis of geologic materials using an automated x-ray fluorescence system.
- Published in:
- XRS: X-ray Spectrometry, 1980, v. 9, n. 4, p. 198, doi. 10.1002/xrs.1300090411
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- Publication type:
- Article
Quantitative röntgenfluoreszenzanalyse mit hilfedes linearen und quadratischen hybridmodells.
- Published in:
- XRS: X-ray Spectrometry, 1980, v. 9, n. 4, p. 170, doi. 10.1002/xrs.1300090406
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- Publication type:
- Article
X-ray emission intensities of radioisotopes produced by neutron activation.
- Published in:
- XRS: X-ray Spectrometry, 1980, v. 9, n. 4, p. 159, doi. 10.1002/xrs.1300090404
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- Publication type:
- Article
Correction for matrix effects in x-ray fluorescence analysis of finite media.
- Published in:
- XRS: X-ray Spectrometry, 1980, v. 9, n. 4, p. 154, doi. 10.1002/xrs.1300090403
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- Publication type:
- Article
Relationship between the reciprocal of analyte--line intensity and the reciprocal of weight fraction and its utilization in x-ray fluorescence analysis.
- Published in:
- XRS: X-ray Spectrometry, 1980, v. 9, n. 4, p. 176, doi. 10.1002/xrs.1300090407
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- Publication type:
- Article
Editorial.
- Published in:
- XRS: X-ray Spectrometry, 1980, v. 9, n. 4, p. 153, doi. 10.1002/xrs.1300090402
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- Article
Recent developments in detectors for process control x-ray sensors.
- Published in:
- XRS: X-ray Spectrometry, 1980, v. 9, n. 4, p. 184, doi. 10.1002/xrs.1300090408
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- Publication type:
- Article
A practical relation between atomic numbers and alpha coefficients.
- Published in:
- XRS: X-ray Spectrometry, 1980, v. 9, n. 4, p. 195, doi. 10.1002/xrs.1300090410
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- Publication type:
- Article
Masthead.
- Published in:
- XRS: X-ray Spectrometry, 1980, v. 9, n. 4, p. fmi, doi. 10.1002/xrs.1300090401
- Publication type:
- Article
Qualitative and quantitative analysis of technical aluminium phosphide.
- Published in:
- XRS: X-ray Spectrometry, 1980, v. 9, n. 4, p. 163, doi. 10.1002/xrs.1300090405
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- Publication type:
- Article
Space resolved x-ray spectroscopy for tokamak.
- Published in:
- XRS: X-ray Spectrometry, 1980, v. 9, n. 4, p. 189, doi. 10.1002/xrs.1300090409
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- Publication type:
- Article
Multielement thin film standards for XRF analysis.
- Published in:
- XRS: X-ray Spectrometry, 1980, v. 9, n. 4, p. 206, doi. 10.1002/xrs.1300090412
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- Publication type:
- Article