Editorial.
- Published in:
- XRS: X-ray Spectrometry, 1979, v. 8, n. 4, p. 145, doi. 10.1002/xrs.1300080402
- By:
- Publication type:
- Article
Works matching IS 00498246 AND DT 1979 AND VI 8 AND IP 4
Results: 17
1
2
Retardation of ammonium acid phthalate crystal surface decomposition.
- Published in:
- XRS: X-ray Spectrometry, 1979, v. 8, n. 4, p. 199, doi. 10.1002/xrs.1300080413
- By:
- Publication type:
- Article
3
Prediction of mass absorption coefficients from inelastically scattered X-radiation for specimens of less than 'infinite thickness'.
- Published in:
- XRS: X-ray Spectrometry, 1979, v. 8, n. 4, p. 164, doi. 10.1002/xrs.1300080406
- By:
- Publication type:
- Article
4
Product news.
- Published in:
- XRS: X-ray Spectrometry, 1979, v. 8, n. 4, p. vi, doi. 10.1002/xrs.1300080417
- Publication type:
- Article
5
Masthead.
- Published in:
- XRS: X-ray Spectrometry, 1979, v. 8, n. 4, p. fmi, doi. 10.1002/xrs.1300080401
- Publication type:
- Article
6
Visual CRO display of pulse height distribution including discriminator setting for a single channel X-ray analyser.
- Published in:
- XRS: X-ray Spectrometry, 1979, v. 8, n. 4, p. 196, doi. 10.1002/xrs.1300080412
- By:
- Publication type:
- Article
7
Trace analysis of estuarine brown algae by energy-dispersive X-ray fluorescence.
- Published in:
- XRS: X-ray Spectrometry, 1979, v. 8, n. 4, p. 159, doi. 10.1002/xrs.1300080405
- By:
- Publication type:
- Article
8
Forthcoming conferences & meetings.
- Published in:
- XRS: X-ray Spectrometry, 1979, v. 8, n. 4, p. vi, doi. 10.1002/xrs.1300080416
- Publication type:
- Article
9
Quantitative volumetric determination of gamma-2 content in dental amalgam by electron microprobe analysis.
- Published in:
- XRS: X-ray Spectrometry, 1979, v. 8, n. 4, p. 180, doi. 10.1002/xrs.1300080409
- By:
- Publication type:
- Article
10
The family of alpha coefficients in X-ray fluorescence analysis.
- Published in:
- XRS: X-ray Spectrometry, 1979, v. 8, n. 4, p. 190, doi. 10.1002/xrs.1300080411
- By:
- Publication type:
- Article
11
Element mapping by a scanning X-ray system.
- Published in:
- XRS: X-ray Spectrometry, 1979, v. 8, n. 4, p. 149, doi. 10.1002/xrs.1300080404
- By:
- Publication type:
- Article
12
Erratum.
- Published in:
- XRS: X-ray Spectrometry, 1979, v. 8, n. 4, p. v, doi. 10.1002/xrs.1300080415
- Publication type:
- Article
13
Ion-implaned reference standards for the analysis of surface impurities by X-ray fluorescence spectrometry.
- Published in:
- XRS: X-ray Spectrometry, 1979, v. 8, n. 4, p. 175, doi. 10.1002/xrs.1300080408
- By:
- Publication type:
- Article
14
X-Ray production by 11-27 MeV alpha particles.
- Published in:
- XRS: X-ray Spectrometry, 1979, v. 8, n. 4, p. 186, doi. 10.1002/xrs.1300080410
- By:
- Publication type:
- Article
15
Comparison between experimental and calculated relative escape peak intensities for an intrinsic Ge detector in the energy region 11-25 keV.
- Published in:
- XRS: X-ray Spectrometry, 1979, v. 8, n. 4, p. 146, doi. 10.1002/xrs.1300080403
- By:
- Publication type:
- Article
16
Calibration standards.
- Published in:
- XRS: X-ray Spectrometry, 1979, v. 8, n. 4, p. 200, doi. 10.1002/xrs.1300080414
- Publication type:
- Article
17
An estimation of selected methods for the correction of interelement effects in X-ray fluorescence analysis.
- Published in:
- XRS: X-ray Spectrometry, 1979, v. 8, n. 4, p. 169, doi. 10.1002/xrs.1300080407
- By:
- Publication type:
- Article