Editorial.
- Published in:
- XRS: X-ray Spectrometry, 1979, v. 8, n. 2, p. 51, doi. 10.1002/xrs.1300080202
- By:
- Publication type:
- Article
Works matching IS 00498246 AND DT 1979 AND VI 8 AND IP 2
Results: 18
1
2
X-ray spectrometry (practical spectroscopy series, vol. 2). H.K. Herglotz and L.S. Birks, Editors, Marcell Dekker, New York, 1978, xi + 513 pp., $49.50.
- Published in:
- XRS: X-ray Spectrometry, 1979, v. 8, n. 2, p. v, doi. 10.1002/xrs.1300080213
- By:
- Publication type:
- Article
3
Escape peak losses in Si(Li) detectors.
- Published in:
- XRS: X-ray Spectrometry, 1979, v. 8, n. 2, p. 65, doi. 10.1002/xrs.1300080206
- By:
- Publication type:
- Article
4
Forthcoming conferences & meetings.
- Published in:
- XRS: X-ray Spectrometry, 1979, v. 8, n. 2, p. vii, doi. 10.1002/xrs.1300080217
- Publication type:
- Article
5
Masthead.
- Published in:
- XRS: X-ray Spectrometry, 1979, v. 8, n. 2, p. fmi, doi. 10.1002/xrs.1300080201
- Publication type:
- Article
6
Empirical method of matrix effect elimination for samples of 'intermediate' thickness in EDXRF analysis.
- Published in:
- XRS: X-ray Spectrometry, 1979, v. 8, n. 2, p. 92, doi. 10.1002/xrs.1300080212
- By:
- Publication type:
- Article
7
The PIXE facility at Eindhoven University of Technology.
- Published in:
- XRS: X-ray Spectrometry, 1979, v. 8, n. 2, p. 63, doi. 10.1002/xrs.1300080205
- By:
- Publication type:
- Article
8
Courses.
- Published in:
- XRS: X-ray Spectrometry, 1979, v. 8, n. 2, p. vi, doi. 10.1002/xrs.1300080216
- Publication type:
- Article
9
Determination without standards of small amounts of metal compounds on microfilters by X-ray fluorescence spectrometry.
- Published in:
- XRS: X-ray Spectrometry, 1979, v. 8, n. 2, p. 76, doi. 10.1002/xrs.1300080209
- By:
- Publication type:
- Article
10
New basic empirical expression for computing tables of X-ray mass attenuation coefficients.
- Published in:
- XRS: X-ray Spectrometry, 1979, v. 8, n. 2, p. 85, doi. 10.1002/xrs.1300080211
- By:
- Publication type:
- Article
11
Totalreflexions-Röntgenfluoreszenzanalyse.
- Published in:
- XRS: X-ray Spectrometry, 1979, v. 8, n. 2, p. 57, doi. 10.1002/xrs.1300080204
- By:
- Publication type:
- Article
12
Conference report.
- Published in:
- XRS: X-ray Spectrometry, 1979, v. 8, n. 2, p. vi, doi. 10.1002/xrs.1300080215
- By:
- Publication type:
- Article
13
A fundamental parameter method for analysis of alloys by isotope-excited X-ray fluorescence.
- Published in:
- XRS: X-ray Spectrometry, 1979, v. 8, n. 2, p. 73, doi. 10.1002/xrs.1300080208
- By:
- Publication type:
- Article
14
Deconvolution of energy-dispersive X-ray peaks using the poisson probability function.
- Published in:
- XRS: X-ray Spectrometry, 1979, v. 8, n. 2, p. 79, doi. 10.1002/xrs.1300080210
- By:
- Publication type:
- Article
15
The atomic number Z=0: Loss and gain on ignition in XRF analysis treated by the JN-equations.
- Published in:
- XRS: X-ray Spectrometry, 1979, v. 8, n. 2, p. 52, doi. 10.1002/xrs.1300080203
- By:
- Publication type:
- Article
16
Introduction to X-ray spectrometric analysis. Eugene P. Bertin, Plenum Press, New York, 1978, 485 pp., $34.20.
- Published in:
- XRS: X-ray Spectrometry, 1979, v. 8, n. 2, p. v, doi. 10.1002/xrs.1300080214
- By:
- Publication type:
- Article
17
X-Ray fluorescence analysis in the X-ray region of 0.4 to 7 nm: Application to determination of fluorine in slags.
- Published in:
- XRS: X-ray Spectrometry, 1979, v. 8, n. 2, p. 68, doi. 10.1002/xrs.1300080207
- By:
- Publication type:
- Article
18
Product news.
- Published in:
- XRS: X-ray Spectrometry, 1979, v. 8, n. 2, p. vii, doi. 10.1002/xrs.1300080218
- Publication type:
- Article