Works matching IS 00498246 AND DT 1974 AND VI 3 AND IP 4
1
- XRS: X-ray Spectrometry, 1974, v. 3, n. 4, p. 135, doi. 10.1002/xrs.1300030402
- Article
2
- XRS: X-ray Spectrometry, 1974, v. 3, n. 4, p. A27, doi. 10.1002/xrs.1300030413
- Article
3
- XRS: X-ray Spectrometry, 1974, v. 3, n. 4, p. 151, doi. 10.1002/xrs.1300030406
- Article
4
- XRS: X-ray Spectrometry, 1974, v. 3, n. 4, p. A31, doi. 10.1002/xrs.1300030417
- Article
5
- XRS: X-ray Spectrometry, 1974, v. 3, n. 4, p. fmi, doi. 10.1002/xrs.1300030401
- Article
6
- XRS: X-ray Spectrometry, 1974, v. 3, n. 4, p. 176, doi. 10.1002/xrs.1300030412
- Ebel, H.;
- Fuchs, G.;
- Gurker, N.;
- Wernisch, J.
- Article
7
- XRS: X-ray Spectrometry, 1974, v. 3, n. 4, p. 149, doi. 10.1002/xrs.1300030405
- Smith, D. G. W.;
- Reed, S. J. B.;
- Ware, N. G.
- Article
8
- XRS: X-ray Spectrometry, 1974, v. 3, n. 4, p. A29, doi. 10.1002/xrs.1300030416
- Article
9
- XRS: X-ray Spectrometry, 1974, v. 3, n. 4, p. 167, doi. 10.1002/xrs.1300030409
- Article
10
- XRS: X-ray Spectrometry, 1974, v. 3, n. 4, p. 172, doi. 10.1002/xrs.1300030411
- Chung, Frank H.;
- Lentz, August J.;
- Scott, Richard W.
- Article
11
- XRS: X-ray Spectrometry, 1974, v. 3, n. 4, p. 143, doi. 10.1002/xrs.1300030404
- Article
12
- XRS: X-ray Spectrometry, 1974, v. 3, n. 4, p. A28, doi. 10.1002/xrs.1300030415
- Article
13
- XRS: X-ray Spectrometry, 1974, v. 3, n. 4, p. 159, doi. 10.1002/xrs.1300030408
- Article
14
- XRS: X-ray Spectrometry, 1974, v. 3, n. 4, p. 170, doi. 10.1002/xrs.1300030410
- Gould, R. W.;
- Healey, J. T.
- Article
15
- XRS: X-ray Spectrometry, 1974, v. 3, n. 4, p. 137, doi. 10.1002/xrs.1300030403
- Wittmann, A.;
- Chmeleff, J.;
- Herrmann, H.
- Article
16
- XRS: X-ray Spectrometry, 1974, v. 3, n. 4, p. A28, doi. 10.1002/xrs.1300030414
- Article
17
- XRS: X-ray Spectrometry, 1974, v. 3, n. 4, p. 153, doi. 10.1002/xrs.1300030407
- Statham, P. J.;
- Long, J. V. P.;
- White, G.;
- Kandiah, K.
- Article