Works in Technometrics, 2000, Vol 42, Issue 3
23
- 2000
- Mudivarthy, Surekha;
- Rao, M. Bhaskara
- Book Review
42
- Technometrics, 2000, v. 42, n. 3, p. 227, doi. 10.2307/1271078
- Article
44
- Technometrics, 2000, v. 42, n. 3, p. 300, doi. 10.1080/00401706.2000.10486050
- Article
45
- Technometrics, 2000, v. 42, n. 3, p. 290, doi. 10.1080/00401706.2000.10486049
- Yang, Jiangbin;
- Makis, Viliam
- Article
46
- Technometrics, 2000, v. 42, n. 3, p. 277, doi. 10.1080/00401706.2000.10486048
- Article
47
- Technometrics, 2000, v. 42, n. 3, p. 262, doi. 10.1080/00401706.2000.10486047
- Article
48
- Technometrics, 2000, v. 42, n. 3, p. 249, doi. 10.1080/00401706.2000.10486046
- McKean, Joseph W.;
- Sheather, Simon J.
- Article
49
- Technometrics, 2000, v. 42, n. 3, p. 237, doi. 10.1080/00401706.2000.10486045
- Fang, Kai-Tai;
- Winker, Peter;
- Lin, Dennis K. J.;
- Zhang, Yong
- Article